Deep learning for smart industry: Efficient manufacture inspection system with fog computing
With the rapid development of Internet of things devices and network infrastructure, there
have been a lot of sensors adopted in the industrial productions, resulting in a large size of …
have been a lot of sensors adopted in the industrial productions, resulting in a large size of …
A guide to image and video based small object detection using deep learning: Case study of maritime surveillance
Small object detection (SOD) in optical images and videos is a challenging problem that
even state-of-the-art generic object detection methods fail to accurately localize and identify …
even state-of-the-art generic object detection methods fail to accurately localize and identify …
Inspection of IC wafer Defects Based on Image Registration
X Liu, Y Hu - 2018 IEEE 3rd Advanced Information Technology …, 2018 - ieeexplore.ieee.org
An automatic integrated circuit (IC) wafer inspection system based on image registration has
been developed. This inspection system addresses the task of detection the key defects on …
been developed. This inspection system addresses the task of detection the key defects on …
Industrial Environmental Monitoring and Rectifying System
V Chithra, B Karthikeyan… - … Conference on Power …, 2022 - ieeexplore.ieee.org
The creation of embedded systems has shown to be a dependable method for keeping track
of and improving the industrial environment. The project's aim is to create a structure that …
of and improving the industrial environment. The project's aim is to create a structure that …
Robust Image Wafer Inspection
M Barone - 2020 Tenth International Conference on Image …, 2020 - ieeexplore.ieee.org
This paper presents a deep improvement of template matching technique for detecting
defects in VLSI, very large-scale integration, wafer images. This method is more robust to the …
defects in VLSI, very large-scale integration, wafer images. This method is more robust to the …