Group-III-nitride and halide-perovskite semiconductor gain media for amplified spontaneous emission and lasing applications

TK Ng, JA Holguin-Lerma, CH Kang… - Journal of Physics D …, 2021 - iopscience.iop.org
Group-III-nitride optical devices are conventionally important for displays and solid-state
lighting, and recently have garnered much interest in the field of visible-light communication …

Research Progress in Liquid Phase Growth of GaN Crystals

D Sun, L Liu, G Wang, J Yu, Q Li, G Tian… - … A European Journal, 2024 - Wiley Online Library
As a wide band gap semiconductor, gallium nitride (GaN) has high breakdown voltage,
excellent structural stability and mechanical properties, giving it unique advantages in …

Light-emitting V-pits: An alternative approach toward luminescent indium-rich InGaN quantum dots

JY Chung, Z Li, SA Goodman, J So… - ACS …, 2021 - ACS Publications
Realization of fully solid-state white light emitting devices requires high efficiency blue,
green, and red emitters. However, challenges remain in boosting the low quantum efficiency …

Heterogeneous integration toward a monolithic 3-D chip enabled by III–V and Ge materials

SH Kim, SK Kim, JP Shim, DM Geum… - IEEE Journal of the …, 2018 - ieeexplore.ieee.org
Monolithic 3-D integration has emerged as a promising technological solution for traditional
transistor scaling limitations and interconnection bottleneck. The challenge we must …

Investigation and reduction of RF loss induced by Al diffusion at the AlN/Si (111) interface in GaN-based HEMT buffer stacks

C Mauder, H Hahn, M Marx, Z Gao… - Semiconductor …, 2021 - iopscience.iop.org
GaN-based high electron mobility transistors (HEMT) on Si (111) substrates have large
potential for applications in the 5G telecommunication field. However, for this potential to be …

A highly sensitive and robust GaN ultraviolet photodetector fabricated on 150-mm Si (111) wafer

RS Pokharia, R Sarkar, S Singh, S Deb… - … on Electron Devices, 2021 - ieeexplore.ieee.org
In this work, we demonstrate the potential of a gallium nitride (GaN)-based visible-blind
ultraviolet (UV) photodetector (PD) on a commercially viable 150-mm Si wafer. The influence …

Unlocking the origin of compositional fluctuations in InGaN light emitting diodes

TP Mishra, GJ Syaranamual, Z Deng, JY Chung… - Physical Review …, 2021 - APS
The accurate determination of compositional fluctuations is pivotal in understanding their
role in the reduction of efficiency in high indium content In x Ga 1–x N light emitting diodes …

Atomic-Scale Characterization of Extended Defects in Wurtzite GaN Heterostructures

JY Chung, L Zhang, GJ Syaranamual… - ACS Applied Nano …, 2023 - ACS Publications
We present an overview of the atomic structure of extended defects in wurtzite III-nitrides,
focusing on GaN heterostructures applicable to light-emitting optoelectronic devices (LEDs …

Monolithic integration of Si-CMOS and III-V-on-Si through direct wafer bonding process

KH Lee, Y Wang, B Wang, L Zhang… - IEEE Journal of the …, 2017 - ieeexplore.ieee.org
Integration of silicon-complementary metal oxide-semiconductor (Si-CMOS) and III-V
compound semiconductors (with device structures of either InGaAs HEMT, AlGaInP LED …

Nanostructured InGaN quantum wells as a surface-enhanced Raman scattering substrate with expanded hot spots

FC Chien, TF Zhang, C Chen… - ACS Applied Nano …, 2021 - ACS Publications
Surface-enhanced Raman scattering (SERS) is a technique that can deliver label-free, real-
time, and multiplex detection of target molecules. However, the development of this potential …