Structural Process Variation on Silicon Nanotube Tunnel Field-Effect Transistor

P Rajendiran, A Nisha Justeena - Silicon, 2023 - Springer
In this manuscript, we have investigated the geometrical process variation of a 3-dimensinal
silicon nanotube tunnel field effect transistor (Silicon NT-TFET) using TCAD numerical …

Characterizing the carbon nanotube field effect transistor: a geometric variation study

NS Suhaimi, H Hussin - ECS Journal of Solid State Science and …, 2020 - iopscience.iop.org
This research is focusing on the geometrical variation effects of carbon nanotube field effect
transistor (CNTFET). The characteristics of the CNTFET are observed based on different …

Sensitivity analysis of junctionless silicon NT-TFET and performance metrics comparison with the silicon NT-TFET

P Rajendiran, AN Justeena, J Mrabet… - Journal of Nanoparticle …, 2024 - Springer
In this article, we investigated the sensitivity of the junctionless silicon nanotube tunnel field-
effect transistor (JLSiNT-TFET). To accomplish this, we utilized the Sentaurus TCAD …

Effect of dimension parameters on the optical properties of a single silicon nanotube

J Tong, M Zhang, Y Lei - Optik, 2020 - Elsevier
Silicon nanotube (SiNT) is a new semiconductor nanostructure prepared in recent years,
which has unique optical properties. However, there is still no specific study on the optical …

Performance enhancement of junctionless silicon nanotube gate-all-around FETs for nano-scaled devices

B Singh, R Devi, S Bala - Multiscale and Multidisciplinary Modeling …, 2024 - Springer
This paper presents a novel structure of TSV-based silicon nanotube gate-all-around FETs
(both junction-based and junctionless) along with their electrical characteristics using …

Dual doped ring reconfigurable FET and its process variation analysis using random forest algorithm

I Chatterjee, R Srinivasan - Micro and Nanostructures, 2025 - Elsevier
This work combines three concepts,(i) reconfigurability,(ii) dual doped source-drain, and (iii)
Ring FET to propose dual doped ring reconfigurable FET (D 2 R 2 FET). The proposed …

Performance analysis of ultrathin junctionless double gate vertical MOSFETs

KE Kaharudin, Z Napiah, F Salehuddin… - Bulletin of Electrical …, 2019 - beei.org
The main challenge in MOSFET minituarization is to form an ultra-shallow source/drain (S/D)
junction with high doping concentration gradient, which requires an intricate S/D and …

[PDF][PDF] Work function variations on electrostatic and RF performances of JLSDGM Device

KE Kaharudin, F Salehuddin, ASM Zain… - Indonesian Journal of …, 2021 - researchgate.net
This paper offers a systematic analysis on the impact of work function (WF) variations on
electrostatic and radio frequency (RF) performances of nchannel junctionless strained …

Sensitivity Analysis of Gallium Nitride Quantum Dot LED

K Sumathi, KK Nagarajan… - … of Nanoelectronics and …, 2021 - ingentaconnect.com
The main objective of this research is to present the impact of several doping and
geometrical parameters on the performance of the GaN/AlGaN quantum dot-based light …