GaN-based power high-electron-mobility transistors on Si substrates: from materials to devices

N Wu, Z Xing, S Li, L Luo, F Zeng… - … Science and Technology, 2023 - iopscience.iop.org
Conventional silicon (Si)-based power devices face physical limitations—such as switching
speed and energy efficiency—which can make it difficult to meet the increasing demand for …

Impact of silicon nitride stoichiometry on the effectiveness of AlGaN/GaN HEMT field plates

WM Waller, M Gajda, S Pandey… - … on Electron Devices, 2017 - ieeexplore.ieee.org
Field plate (FP) control of current collapse and channel electric field distribution in
AlGaN/GaN High Electron Mobility Transistors is investigated as a function of low-pressure …

Threshold voltage engineering in GaN-based HFETs: A systematic study with the threshold voltage reaching more than 2 V

H Hahn, F Benkhelifa, O Ambacher… - … on Electron Devices, 2014 - ieeexplore.ieee.org
One of the key challenges for the adoption of gallium nitride (GaN)-based heterostructure
field effect transistors (HFETs) in power-switching applications is obtaining enhancement …

Charge balancing in GaN-based 2-D electron gas devices employing an additional 2-D hole gas and its influence on dynamic behaviour of GaN-based …

H Hahn, B Reuters, S Geipel, M Schauerte… - Journal of Applied …, 2015 - pubs.aip.org
GaN-based heterostructure FETs (HFETs) featuring a 2-D electron gas (2DEG) can offer
very attractive device performance for power-switching applications. This performance can …

Introspection into reliability aspects in AlGaN/GaN HEMTs with gate geometry modification

S Bordoloi, A Ray, G Trivedi - IEEE Access, 2021 - ieeexplore.ieee.org
Reliability enhancement of AlGaN/GaN HEMT is a significant thrust area due to rapidly
improving material and processing technology. In this paper, a detailed analysis of gate …

[图书][B] Threshold voltage engineering of GaN-based n-channel and p-channel heterostructure field effect transistors

H Hahn - 2015 - publications.rwth-aachen.de
Alternative materials are currently considered to replace Si in diverse areas of solidstate
electronics. One of these areas is power-switching. By increasing the efficiency of power …

GaN-on-Si enhancement mode metal insulator semiconductor heterostructure field effect transistor with on-current of 1.35 A/mm

H Hahn, F Benkhelifa, O Ambacher… - Japanese Journal of …, 2013 - iopscience.iop.org
GaN-on-Si transistors are regarded as a candidate for future power-switching applications.
Beside the necessity to achieve enhancement mode behavior, on-resistance and maximum …

Leakage current paths in isolated algan/gan heterostructures

J Moereke, E Morvan, W Vandendaele… - IEEE Transactions …, 2016 - ieeexplore.ieee.org
Electrical characterization of AlGaN/GaN heterojunctions isolated by Ar-implantation
identified three conduction regimes. These include an Ohmic regime below 100 V …

[HTML][HTML] Liquid crystal electrography: Electric field mapping and detection of peak electric field strength in AlGaN/GaN high electron mobility transistors

J Möreke, C Hodges, LLE Mears, MJ Uren… - Microelectronics …, 2014 - Elsevier
The liquid crystal mixture E7, based on cyanobiphenyl, has been successfully employed to
map electric field strength and distribution in AlGaN/GaN high electron mobility transistors …

Impact of field-plate geometry on the reliability of GaN-on-SiC HEMTs

A Chini, F Soci, F Fantini, A Nanni, A Pantellini… - Microelectronics …, 2013 - Elsevier
Abstract GaN on SiC HEMTs fabricated with different gate-connected field plate structures
have been tested by means of RF reliability tests. The increase in field-plate length yielded …