Multiparameter investigation of diamond plates with optical time-stretch quantitative phase imaging

Y Weng, G Wu, R Li, L Mei, S Wei, Y Yao… - Crystal Growth & …, 2022 - ACS Publications
Diamond is considered the ultimate semiconductor for its excellent physical and chemical
properties, while the defects formed during the growth significantly limit the performance of …

[HTML][HTML] High phosphorous incorporation in (100)-oriented MP CVD diamond growth

F Lloret, B Soto, R Rouzbahani, M Gutiérrez… - Diamond and Related …, 2023 - Elsevier
Diamond n-type layers are crucial for the development of a new bipolar diamond-based
electronic technology. However, the difficulties to incorporate impurity atoms into the …

Monitoring the Optical Surface Purity of Components by an Ellipsometric Method

SA Filin, VE Rogalin, IA Kaplunov - Journal of Applied Spectroscopy, 2022 - Springer
The possibility of monitoring the chemical purity of the surface of optical components by an
ellipsometric method is analyzed. The rationale for the possible measurement of the …

High phosphorous incorporation in (100)-oriented MP CVD diamond growth

FM Lloret Vieira, B Soto Portillo, M Gutiérrez Peinado… - 2023 - rodin.uca.es
Diamond n-type layers are crucial for the development of a new bipolar diamond-based
electronic technology. However, the difficulties to incorporate impurity atoms into the …

Учредители: Институт физики им. БИ Степанова НАН Беларуси

СА ФИЛИН, ВЕ РОГАЛИН… - ЖУРНАЛ ПРИКЛАДНОЙ …, 2022 - elibrary.ru
Проанализирована возможность контроля химической чистоты поверхности
оптических элементов эллипсометрическим методом. Приведено обоснование …

Контроль чистоты поверхности оптических элементов эллипсометрическим методом

СА Филин, ВЕ Рогалин… - Журнал прикладной …, 2022 - zhps.ejournal.by
Аннотация Проанализирована возможность контроля химической чистоты
поверхности оптических элементов эллипсометрическим методом. Приведено …