Zinc gallate (ZnGa2O4) epitaxial thin films: determination of optical properties and bandgap estimation using spectroscopic ellipsometry
Electronic grade ZnGa_2O_4 epitaxial thin films were grown on c-plane sapphire substrates
by metal-organic chemical vapor deposition and investigated using spectroscopic …
by metal-organic chemical vapor deposition and investigated using spectroscopic …
The optical functions of metal phthalocyanines
The optical properties of five metal phthalocyanines (MPcs) thin films (cobalt phthalocyanine
(Pc), copper Pc, iron Pc (FePc), nickel Pc, and zinc Pc), were studied by spectroscopic …
(Pc), copper Pc, iron Pc (FePc), nickel Pc, and zinc Pc), were studied by spectroscopic …
Optical properties of copper phthalocyanine
AB Djurišić, CY Kwong, TW Lau, WL Guo, EH Li… - Optics …, 2002 - Elsevier
Optical functions of copper phthalocyanine (CuPc) have been determined using
spectroscopic ellipsometry in the spectral range from 1.55 to 4.1 eV. The samples have been …
spectroscopic ellipsometry in the spectral range from 1.55 to 4.1 eV. The samples have been …
Monolithic SOI through-wafer Knudsen pumps with mechanically robust Si channels
Knudsen pumps (KPs) generate gas flow using thermal transpiration in narrow channels
with a longitudinal temperature gradient. With no moving parts, KPs offer long lifetime and …
with a longitudinal temperature gradient. With no moving parts, KPs offer long lifetime and …
Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method
We used numerical simulations based on the finite-element method (FEM) to calculate both
the amplitude and phase information of the scattered electric field from random rough …
the amplitude and phase information of the scattered electric field from random rough …
Optical characterization of macro-, micro-and nanostructures using polarized light
Reflection of light measured in a polarimetric, scatterometric and spectroscopic way allows
the measurement of structures in a broad size range from large (meter) scales like …
the measurement of structures in a broad size range from large (meter) scales like …
Parameterization of the dielectric function of semiconductor nanocrystals
P Petrik - Physica B: Condensed Matter, 2014 - Elsevier
Optical methods like spectroscopic ellipsometry are sensitive to the structural properties of
semiconductor films such as crystallinity or grain size. The imaginary part of the dielectric …
semiconductor films such as crystallinity or grain size. The imaginary part of the dielectric …
Optical characteristics of intrinsic microcrystalline silicon
KH Jun, R Carius, H Stiebig - Physical Review B, 2002 - APS
We studied the optical properties of intrinsic microcrystalline silicon (μ c− S i: H) deposited
by very high frequency plasma-enhanced chemical-vapor deposition system at different …
by very high frequency plasma-enhanced chemical-vapor deposition system at different …
Accurate ion beam analysis in the presence of surface roughness
SL Molodtsov, AF Gurbich… - Journal of Physics D …, 2008 - iopscience.iop.org
Ion beam analysis (IBA) is a powerful materials characterization technique with very wide
applicability. However, despite the fact that most natural and many industrial samples are …
applicability. However, despite the fact that most natural and many industrial samples are …
Cross‐linking and degradation properties of plasma enhanced chemical vapor deposited poly (2‐hydroxyethyl methacrylate)
Abstract Plasma Enhanced Chemical Vapor Deposition (PECVD) of poly‐2‐hydroxyethyl
methacrylate (pHEMA) biocompatible, biodegradable polymer films were produced alone …
methacrylate (pHEMA) biocompatible, biodegradable polymer films were produced alone …