With the development of microwave chips toward high integration, new challenges have
been posed to high-precision microwave field test techniques. In this article, we propose a …

Scanning microwave microscopy (SMM) is a novel metrological tool that advances the
quantitative, nanometric, high-frequency, electrical characterization of a broad range of …

Exploring nanoscale material properties through light-matter interactions is essential to
unveil new phenomena and manipulate materials at the atomic level, paving the way for …

If the Twentieth Century boasted of the Space Age and the Computer Age, the Twenty-First
Century is certainly starting off with the Age of Biology, or at least Biochemistry. The …

Nowadays, microscopy images are significant in medical research and clinical studies.
However, storage and transmission of data such as microscopy images are challenging …

Magnetic force microscopy (MFM) has become one of the most important instruments for
characterizing magnetic materials with nanoscale spatial resolution. When analyzing …

The development of semiconductor technology has enabled the planarization and
miniaturization of microwave sensors and it brought challenge for near-field microwave …

In this article, we propose a quantitative, non-destructive and noninvasive approach to
obtain electromagnetic properties of liquid specimens utilizing a home-designed near-field …

In the field of materials research, scanning microwave microscopy imaging has already
become a vital research tool due to its high sensitivity and nondestructive testing of samples …

Although the scanning microwave microscope (SMM) is based on the atomic force
microscope (AFM), the SMM differs from the AFM by being able to sense subsurface …