Design and management of manufacturing systems for production quality

M Colledani, T Tolio, A Fischer, B Iung, G Lanza… - Cirp Annals, 2014 - Elsevier
Manufacturing companies are continuously facing the challenge of operating their
manufacturing processes and systems in order to deliver the required production rates of …

Survey of recent advances on the interface between production system design and quality

RR Inman, DE Blumenfeld, N Huang, J Li, J Li - IIE transactions, 2013 - Taylor & Francis
Product design's impact on quality is widely recognized. Less well recognized is the impact
of production system design on quality. As quality can be improved by integrating it with the …

A literature review on sampling techniques in semiconductor manufacturing

J Nduhura-Munga, G Rodriguez-Verjan… - IEEE Transactions …, 2013 - ieeexplore.ieee.org
This paper reviews sampling techniques for inspection in semiconductor manufacturing. We
discuss the strengths and weaknesses of techniques developed in the last last 20 years for …

The relationship between corporate social responsibility and corporate performance: Evidence from the US semiconductor industry

WM Lu, WK Wang, HL Lee - International Journal of Production …, 2013 - Taylor & Francis
This study adopts a two-stage approach to explore the relationship between corporate social
responsibility (CSR) and semiconductor companies' performance during 2004–2008. In the …

Towards Bayesian network methodology for predicting the equipment health factor of complex semiconductor systems

MF Bouaziz, E Zamai, F Duvivier - International Journal of …, 2013 - Taylor & Francis
This paper presents a general methodology to improve risk assessment in the specific
workshops of semiconductor manufacturers. We are concerned, in this case, with the …

Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing

M Sahnoun, B Bettayeb, SJ Bassetto… - Journal of Intelligent …, 2016 - Springer
Semiconductor manufacturing processes are very long and complex, needing several
hundreds of individual steps to produce the final product (chip). In this context, the early …

Economic cost models of integrated APC controlled SPC charts

M Park, J Kim, MK Jeong, AMS Hamouda… - … Journal of Production …, 2012 - Taylor & Francis
In this paper, an economic cost model is proposed for processes integrating both automatic
process control (APC) and statistical process control (SPC) for quality monitoring and …

Quality and exposure control in semiconductor manufacturing. Part I: Modelling

B Bettayeb, S Bassetto, P Vialletelle… - International Journal of …, 2012 - Taylor & Francis
The purpose of this paper is to present a heuristic algorithm for quality control planning from
an insurance perspective. The approach proposed here is designed to judiciously allocate …

Skipping algorithms for defect inspection using a dynamic control strategy in semiconductor manufacturing

GL Rodriguez-Verjan, S Dauzère-Pérès… - 2013 Winter …, 2013 - ieeexplore.ieee.org
In this paper, we propose new ways for efficiently managing defect inspection queues in
semiconductor manufacturing when a dynamic sampling strategy is used. The objective is to …

Optimizing return on inspection trough defectivity smart sampling

M Sahnoun, P Vialletelle, S Bassetto… - 2010 International …, 2010 - ieeexplore.ieee.org
In this paper we describe the use of an index to continuously monitor the risk of producing
defective parts in a semiconductor production line. This index is used by product inspection …