Efficient carrier transport for 368 nm ultraviolet LEDs with a p-AlInGaN/AlGaN short-period superlattice electron blocking layer

L He, K Zhang, H Wu, C He, W Zhao, Q Wang… - Journal of Materials …, 2021 - pubs.rsc.org
It is generally known that the p-type AlGaN electron-blocking layer (EBL) can hinder hole
injection for near-ultraviolet light-emitting diodes (NUV-LEDs). Moreover, at the last quantum …

Lifetime prediction of current-and temperature-induced degradation in silicone-encapsulated 365 nm high-power light-emitting diodes

A Herzog, S Benkner, B Zandi, M Buffolo… - IEEE …, 2023 - ieeexplore.ieee.org
We report on the degradation mechanisms and dynamics of silicone encapsulated
ultraviolet A (UV-A) high-power light-emitting diodes (LEDs), with a peak wavelength of. The …

Narrow-band violet light-emitting diodes based on one-dimensional lead bromides

T Cheng, Y Xie, Y Lin, Y Dong, Y Lan, R Chen… - Journal of …, 2023 - Elsevier
Violet electroluminescence is indispensable for wide color gamut and full color displays.
Exploring available, cheaper, and easier processing narrow-band violet light-emitting …

Generation of sidewall defects in InGaN/GaN blue micro-LEDs under forward-current stress

ABMH Islam, TK Kim, DS Shin, JI Shim… - Applied Physics …, 2022 - pubs.aip.org
This work investigates the effect of current stress on InGaN/GaN multiple-quantum-well flip-
chip blue micro light-emitting diodes (μ-LEDs) with a mesa size of 30× 30 μm 2 and …

Understanding Microscopic Properties of Light‐Emitting Diodes from Macroscopic Characterization: Ideality Factor, S‐parameter, and Internal Quantum Efficiency

DS Shin, JI Shim - physica status solidi (a), 2022 - Wiley Online Library
Herein, how the macroscopic characterizations can be utilized to extract information on the
defect level and crystal quality of the epitaxial layers of the light‐emitting diodes (LEDs) is …

Improvement of Ti/Al ohmic contacts on N-face n-type GaN by using O2 plasma treatment

H Seo, YJ Cha, ABMH Islam, JS Kwak - Applied Surface Science, 2020 - Elsevier
The effect of O 2 plasma treatment on the electrical properties of Ti/Al (20/200 nm) contact to
N (Nitrogen)-face n-GaN of vertical light-emitting diodes (VLEDs) has been investigated by …

Effects of gamma radiation on the electrical properties of InAs/InGaAs quantum dot-based laser structures grown on GaAs and Si substrates by molecular beam …

M Al Huwayz, DA Jameel, WM de Azevedo… - Physical Chemistry …, 2024 - pubs.rsc.org
This study investigates the impact of gamma radiation on the electrical properties of
InAs/InGaAs quantum dot-based laser structures grown on both GaAs (Sample A) and Si …

Temperature-Induced Stress Performance of High-Density GaN Micro-LED Arrays for Industrial Mass Production

EJ Youn, TK Kim, ABMH Islam, J Kim… - ACS Applied …, 2024 - ACS Publications
The high-temperature-induced stress performance of GaN-based blue micro light emitting-
diode (micro-LED) arrays with a pixel size of 5× 5 μm2 (6 μm pitch) is studied, and …

Temperature-dependent efficiency droop in GaN-based blue micro light-emitting diodes

ABMH Islam, TK Kim, YJ Cha, DS Shin… - ECS Journal of Solid …, 2023 - iopscience.iop.org
This work investigates the size-dependent decrease in external quantum efficiency (EQE) of
various InGaN/GaN multiple-quantum-well flip-chip blue micro light-emitting diodes (μ …

Nonpolar GaN-based nanopillar green Light-Emitting Diode (Led) fabricated by using self-aligned In3Sn nanodots

MJ Park, ABMH Islam, YJ Cha, JS Kwak - Applied Surface Science, 2021 - Elsevier
Abstract We fabricate nonpolar InGaN/GaN single quantum-well based a-plane nanopillar
green light-emitting diode (LED). The top-down fabrication method was used for fabricating …