Electrical Characterization of InAs/(GaIn) Sb Infrared Superlattice Photodiodes for the 8 to 12νm Range

L Bürkle, F Fuchs, R Kiefer, W Pletschen… - MRS Online …, 1999 - cambridge.org
AbstractInAs/(GaIn) Sb superlattice photodiodes with a cutoff wavelength of 8.711 μm show
adynamic impedance of R0A= 1.5 kωcm2at 77 K and a responsivity of 2 A/W, corresponding …

The set of photoelectromagnetic methods for determination of recombination and diffusion parameters of p-MCT thin films

DY Protasov, AV Trifanov… - The European Physical …, 2013 - cambridge.org
In this paper the set of photoelectromagnetic methods for determination of recombination
and diffusion parameters of charge carriers in p-type mercury cadmium telluride epitaxial …

Electron mobility in p-type epitaxially grown Hg1-xCdxTe

NT Gordon, S Barton, P Capper… - Semiconductor …, 1993 - iopscience.iop.org
The electron minority carrier mobility is an important parameter because of its effect on the
diffusion length for determining the performance of semiconductor infrared detectors. The …

Method for the simultaneous determination of vertical and horizontal mobilities in superlattices

CH Swartz, TH Myers - Physical Review B, 2014 - APS
A magnetoresistance method is proposed which extracts both the growth direction mobility
and the planar mobility of an anisotropic thin film, such as a superlattice. A magnetic field …

[PDF][PDF] Фотоэлектромагнитный комплекс методов определения рекомбинационно-диффузионных параметров носителей заряда в эпитаксиальных пленках …

ВЯ Костюченко, ДЮ Протасов - … университета. Серия: Физика, 2011 - phys.nsu.ru
В работе предлагается развитый для эпитаксиальных пленок кадмий–ртуть–теллур р-
типа фотоэлектромагнитный комплекс методов определения рекомбинационно …

Analysis of the product in and photodiodes

V Dhar, R Ashokan, ZAD Khan… - … science and technology, 1996 - iopscience.iop.org
The effect of the layer in a structure made in long-wavelength (x= 0.229) epilayers on the
zero-bias resistance-area product is theoretically analysed, and compared with a structure …

Saturation current and excess carrier distribution in exponentially graded pn junctions

SE Schacham, E Finkman - Journal of applied physics, 1992 - pubs.aip.org
Excess carrier distribution and saturation current generated by a graded p‐n junction are
investigated, approximating the dopant profile by an exponential function. Analytical …

[PDF][PDF] 变磁场IV 法对碲镉汞光伏器件少子扩散特性的研究

贾嘉, 陈新禹, 李向阳, 龚海梅 - 红外与毫米波学报, 2005 - journal.sitp.ac.cn
零偏压电阻一面积乘积(A) 和反向饱和电流密度是决定光电二极管性能的重要参数.
提出了一种对碲镉汞(Hg. 一CdTe) 光伏器件的少子扩散特性进行研究的有效方法 …

The magnetic field dependence of R0A products in n-on-p homojunctions and p-on-n heterojunctions from Hg0.78Cd0.22Te liquid phase epitaxy films

MC Chen, A Turner, L Colombo, D Chandra - Journal of electronic …, 1995 - Springer
The analysis of R 0 A products as a function of magnetic field in n-on-p diodes using a
simple diffusion current model has previously been shown to yield both J ep/J total ratio (the …

Surface and implantation effects on pn junctions

SE Schacham, E Finkman - Semiconductor science and …, 1990 - iopscience.iop.org
The contribution of the graded region of implanted pn junctions is analysed using an
exponential profile. Though previously neglected, the authors have recently shown that this …