The rapid development of processor manufacturing technologies has encouraged most
designers to highlight the processors' resilience to errors. Regarding embedded systems in …

Radiation-induced soft errors, despite rare, pose a significant threat to the reliability of
systems. Assessing the intrinsic resilience of software to soft errors is therefore essential for …

Recently, with increasing system complexity and advanced technology scaling, there is a
severe need for accurate fault injection (FI) techniques in the reliability evaluation of safety …

With the fast technological advancement in submicron devices, today's communication
systems are more demanding for use of ARM based devices in safety critical systems …

The increasing computing capacity of multicore components like processors and graphics
processing units (GPUs) offer new opportunities for embedded and high-performance …

This paper proposes a Recurrent Neural Network (RNN) method for modeling transient fault
effects on microelectronic devices. RNNs can estimate the impacts of glitches propagated …