Composition of wide bandgap semiconductor materials and nanostructures measured by atom probe tomography and its dependence on the surface electric field

L Mancini, N Amirifar, D Shinde, I Blum… - The Journal of …, 2014 - ACS Publications
Atom probe tomography allows for three-dimensional reconstruction of the elemental
distribution in materials at the nanoscale. However, the measurement of the chemical …

DBSR_HF: a B-spline Dirac–Hartree–Fock program

O Zatsarinny, CF Fischer - Computer Physics Communications, 2016 - Elsevier
A B-spline version of a general Dirac–Hartree–Fock program is described. The usual
differential equations are replaced by a set of generalized eigenvalue problems of the form …

Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events

E Di Russo, I Blum, J Houard, M Gilbert, G Da Costa… - Ultramicroscopy, 2018 - Elsevier
A systematic study of the biases occurring in the measurement of the composition of GaN by
Atom Probe Tomography was carried out, in which the role of surface electric field and laser …

Optical contactless measurement of electric field-induced tensile stress in diamond nanoscale needles

L Rigutti, L Venturi, J Houard, A Normand… - Nano …, 2017 - ACS Publications
The application of a high electrostatic field at the apex of monocrystalline diamond
nanoscale needles induces an energy splitting of the photoluminescence lines of color …

Field ion emission in an atom probe microscope triggered by femtosecond-pulsed coherent extreme ultraviolet light

AN Chiaramonti, L Miaja-Avila… - Microscopy and …, 2020 - academic.oup.com
This paper describes initial experimental results from an extreme ultraviolet (EUV) radiation-
pulsed atom probe microscope. Femtosecond-pulsed coherent EUV radiation of 29.6 nm …

Fast modelling of field evaporation in atom probe tomography using level set methods

C Fletcher, MP Moody, D Haley - Journal of Physics D: Applied …, 2019 - iopscience.iop.org
Current imaging algorithms in atom probe tomography (APT) assume a simple geometric
model for the trajectories of evaporated ions between the emitter and detector. Such point …

A study of parameters affecting atom probe tomography specimen survivability

TJ Prosa, S Strennen, D Olson… - Microscopy and …, 2019 - academic.oup.com
Specimen survivability is a primary concern to those who utilize atom probe tomography
(APT) for materials analysis. The state-of-the-art in understanding survivability might best be …

Thermal diffusivity of diamond nanowires studied by laser assisted atom probe tomography

L Arnoldi, M Spies, J Houard, I Blum, A Etienne… - Applied Physics …, 2018 - pubs.aip.org
The thermal properties of single-crystal diamond nanowires (NWs) have been calculated
from first principles but have never been measured experimentally. Taking advantage of the …

Laser-assisted atom probe tomography of semiconductors: The impact of the focused-ion beam specimen preparation

J Bogdanowicz, A Kumar, C Fleischmann, M Gilbert… - Ultramicroscopy, 2018 - Elsevier
This paper demonstrates the increased light absorption efficiency of semiconducting atom
probe tips resulting from focused-ion-beam (FIB) preparation. We use transmission electron …

Simulation of heterogeneous atom probe tip shapes evolution during field evaporation using a level set method and different evaporation models

Z Xu, D Li, W Xu, A Devaraj, R Colby… - Computer Physics …, 2015 - Elsevier
In atom probe tomography (APT), accurate reconstruction of the spatial positions of field
evaporated ions from measured detector patterns depends upon a correct understanding of …