Selecting the relevant layout techniques is a key point to obtain a high-performance
integrated circuit. Most of the common layout techniques, beside allowing the improvement …

One of the threats to nanometric CMOS analog circuit reliability is circuit performance
degradation due to transistor aging. To extend circuit operating life, the bias of the main …

Aging produced by RF stress is experimentally analyzed on a RF CMOS power amplifier
(PA), as a function of the stress power level. The selected circuit topology allows observing …

This paper presents a flexible and portable digital framework for Built-in Self-Test (BIST) and
calibration of RF/analog circuitry. Novel to the proposed testing framework, is a reusable …

Recent studies have shown that transistor variability and ageing phenomena are
responsible for variation of transconductance (gm) and drain current (ID) in MOSFETs. It is …

UHF passive RFID tags have become a natural option for long distance identification (few
meters) as warehouse monitoring and vehicles control access. However, ultra-high …

Reliability is an important issue for circuits in critical applications such as military,
aerospace, energy, and biomedical engineering. With the rise in the failure rate in …

In this work, we have been motivated to innovate in RF front-end design. New analysis and
synthesis methodologies have been proposed including the variability and the ageing …

Les technologies d'intégration des circuits électroniques ont engendré beaucoup de
nouveaux défis pour la conception des circuits et systèmes. Les avancées résultantes de …