Measuring Spatially‐Resolved Potential Drops at Semiconductor Hetero‐Interfaces Using 4D‐STEM
Characterizing long‐range electric fields and built‐in potentials in functional materials at
nano to micrometer scales is of supreme importance for optimizing devices, eg, the …
nano to micrometer scales is of supreme importance for optimizing devices, eg, the …
[HTML][HTML] Measuring electrical properties in semiconductor devices by pixelated STEM and off-axis electron holography (or convergent beams vs. plane waves).
We demonstrate the use of both pixelated differential phase contrast (DPC) scanning
transmission electron microscopy (STEM) and off-axis electron holography (EH) for the …
transmission electron microscopy (STEM) and off-axis electron holography (EH) for the …
Imaging built-in electric fields and light matter by Fourier-precession TEM
We report the precise measurement of electric fields in nanostructures, and high-contrast
imaging of soft matter at ultralow electron doses by transmission electron microscopy (TEM) …
imaging of soft matter at ultralow electron doses by transmission electron microscopy (TEM) …
GaN atomic electric fields from a segmented STEM detector: Experiment and simulation
Atomic electric fields in a thin GaN sample are measured with the centre‐of‐mass approach
in 4D‐scanning transmission electron microscopy (4D‐STEM) using a 12‐segmented STEM …
in 4D‐scanning transmission electron microscopy (4D‐STEM) using a 12‐segmented STEM …
Random forest prediction of crystal structure from electron diffraction patterns incorporating multiple scattering
Diffraction is the most common method to solve for unknown or partially known crystal
structures. However, it remains a challenge to determine the crystal structure of a new …
structures. However, it remains a challenge to determine the crystal structure of a new …
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model
Nanobeam electron diffraction can probe local structural properties of complex crystalline
materials including phase, orientation, tilt, strain, and polarization. Ideally, each diffraction …
materials including phase, orientation, tilt, strain, and polarization. Ideally, each diffraction …
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM
Measuring long-range electric fields by 4-dimensional scanning transmission electron
microscopy (4DSTEM) is on the verge to becoming an established method, though …
microscopy (4DSTEM) is on the verge to becoming an established method, though …
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials
HLL Robert, ML Leidl, K Müller-Caspary… - arXiv preprint arXiv …, 2025 - arxiv.org
This publication presents an investigation of the performance of different analytical electron
ptychography methods for low-dose imaging. In particular, benchmarking is performed for …
ptychography methods for low-dose imaging. In particular, benchmarking is performed for …
[PDF][PDF] Measuring electric fields with 4D-STEM: Demonstration of pitfalls by the example of GaN and SiGe
Background The development of fast pixel-based detectors in (scanning) transmission
electron microscopy ((S) TEM) has resulted in 4D-STEM becoming almost a standard tool …
electron microscopy ((S) TEM) has resulted in 4D-STEM becoming almost a standard tool …
Electronic and Structural Properties of Heterojunctions in Solar Cells studied by In-situ and Analytical Transmission Electron Microscopy
C Flathmann - 2023 - ediss.uni-goettingen.de
The initial research and development of solar cells was mainly motivated by the need to
generate power for satellites 1. Nowadays, the principal application of solar cells has greatly …
generate power for satellites 1. Nowadays, the principal application of solar cells has greatly …