Fail data collection is carried out for faulty units to allow defect diagnosis to be performed.
After passing scan chain tests, fail data collection targets faults in the functional logic …

Failure diagnosis is a software-based, data-driven procedure. Collecting an excessive
amount of fail data not only increases the overall test cost but can also potentially reduce …

This paper presents an algorithm for reducing the test data volume collected by a tester for
defect diagnosis of an IC and the tester time. The tester executes the tests and transfers the …

Procedures that were described earlier increase the accuracy of defect diagnosis by
ignoring small subsets of tests in order to produce smaller candidate fault sets. The premise …

故障诊断是集成电路领域中的重要研究方向, 基于测试激励集方法求解候选故障诊断是目前较为
高效的诊断方法, 而GTreord 是目前具有较高诊断准确性的方法. 在对GTreord …

Failure diagnosis is a software-based data-driven procedure. Collecting an excessive
amount of fail data not only increases the overall test cost, but may also lead to degradation …

Volume diagnosis is an essential step in diagnosis driven yield analysis. Generally,
diagnosis run time increases when more failing patterns are collected in a fail log. In order to …

Iterative scan diagnosis is often needed for both the first silicon and the hard-to-diagnose
chips. The chips in question are extracted from wafers and re-tested on a debug platform to …

Logic diagnosis is a software-based methodology to identify the behavior and location of
defects in failing integrated circuits, which is an essential step in yield learning …

The test patterns computed for detecting the manufacturing defects in the electronic circuits
are generally insufficient for diagnosis. The test set compaction and failure log truncation …