This paper presents a novel test-data volume-compression methodology called the
embedded deterministic test (EDT), which reduces manufacturing test cost by providing one …

We present a new test-data compression method and decompression architecture based on
variable-to-variable-length Golomb codes. The proposed method is especially suitable for …

This paper introduces embedded deterministic test (EDT) technology, which reduces
manufacturing test cost by providing one to two orders of magnitude reduction in scan test …

This paper presents a compression/decompression scheme based on selective Huffman
coding for reducing the amount of test data that must be stored on a tester and transferred to …

Test data compression and test resource partitioning (TRP) are necessary to reduce the
volume of test data for system-on-a-chip designs. We present a new class of variable-to …

This paper presents an overview of an intelligence platform we have built to address threat
hunting and incident investigation use-cases in the cyber security domain. Specifically, we …

We showed recently that Golomb codes can be used for efficiently compressing system-on-a-
chip test data. We now present a new class of variable-to-variable-length compression …

This paper presents a new compression method for embedded core-based system-on-a-
chip test. In addition to the new compression method, this paper analyzes the three test data …

A new lossless test vector compression scheme is presented which combines linear
feedback shift register (LFSR) reseeding and statistical coding in a powerful way. Test …

A test pattern compression scheme is proposed in order to reduce test data volume and
application time. The number of scan chains that can be supported by an ATE is significantly …