Review and novel formulae for transmittance and reflectance of wedged thin films on absorbing substrates

M Ballester, E Marquez, J Bass, C Würsch… - Measurement …, 2025 - iopscience.iop.org
Historically, spectroscopic techniques have been essential for studying the optical properties
of thin solid films. However, existing formulae for both normal transmission and reflection …

Optical Characterization of Thin Films from Transmission Data using Deep Learning

M Ballester, C Würsch, E Marquez… - … Methods, Analysis and …, 2024 - opg.optica.org
Optical Characterization of Thin Films from Transmission Data using Deep Learning Page 1
Optical Characterization of Thin Films from Transmission Data using Deep Learning Manuel …

Enhancing the Swanepoel Method: Precise Envelope Detection of Thin-Film Transmission Spectra

MB Matito, A Marquez, S Lopez-Tapia, S Fernández… - 2024 - preprints.opticaopen.org
The Swanepoel method is a widely used optical technique for characterizing thin films
through normal-incidence transmission measurements. A critical step in this approach …