Effective decapsulation of copper wire-bonded microelectronic devices for reliability assessment

S Manoharan, C Patel, P McCluskey, M Pecht - Microelectronics Reliability, 2018 - Elsevier
The wire bonding industry has made a major shift in wire materials from gold to copper,
primarily due to cost concerns. Copper wire-bonds are now present in many commercial off …

Multi-response optimization of IC wire bonding for large probe marks by the RSM and desirability function approach

JE Chiu, CS Wang, SW Lu - The International Journal of Advanced …, 2022 - Springer
Wire bonding is key to high-quality IC assembly in semiconductor packaging. An electrical
test was conducted before wire bonding. During the electrical test, the needle probes …

Mechanism of wire bond shear testing

S Manoharan, C Patel, S Hunter, P McCluskey - Microelectronics Reliability, 2018 - Elsevier
Shear testing of wire bonds in microelectronics devices is important in bonding process
qualification, but the actual mechanism of shearing Cu bonds from Al pads is not thoroughly …

Aging characteristics of green mold compound for use in encapsulation of microelectronic devices

S Manoharan, C Patel, S Dunford… - 2018 IEEE 68th …, 2018 - ieeexplore.ieee.org
Epoxy mold compounds can exhibit changes in material properties with aging at high
temperature, that can significantly affect reliability of interconnects. This study focuses on …

Shear force classification before wire bonding based on probe mark 2-d images using machine learning methods

CS Wang, JE Chiu - IEEE Transactions on Semiconductor …, 2022 - ieeexplore.ieee.org
The wire bonding process is one of the most critical processes in semiconductor packaging.
The electrical performance and reliability of IC chips must be evaluated by probe testing …

Life prediction of copper wire bonds in commercial devices using principal component analysis (PCA)

S Manoharan, C Patel, S Dunford, J Beshears… - Microelectronics …, 2019 - Elsevier
Copper has been widely adopted as a viable alternative to gold for wire bonding, due to its
lower cost, better electrical and thermal conductivity, lower tendency for wire sweep due to a …

Mechanics of copper wire bond failure due to thermal fatigue

S Manoharan, NMJ Li, C Patel, S Hunter… - 2018 IEEE 20th …, 2018 - ieeexplore.ieee.org
Thermal stresses occur on wire Bonds due to mismatch of coefficient of thermal expansion
(CTE) between wire and mold compound in addition to the global deformation of the …

Influence of initial shear strength on time-to-failure of copper (Cu) wire bonds in thermal aging condition

S Manoharan, C Patel, S Hunter… - Additional Papers …, 2018 - meridian.allenpress.com
Copper (Cu) wire bond is used in a majority of microelectronic devices but has not been fully
accepted by all industries due to potential reliability issues. Good quality bond is believed to …