P Yao, X Li, X Liang, B Yu, F Jin, Y Li - Materials Characterization, 2017 - Elsevier
In this study, the interfacial phase evolution during Cu/Sn/Cu soldering (260° C, 1 N) with a
micro interconnected height of 6 μm was analyzed. During soldering, the Cu 6 Sn 5 …