This paper presents FLOSSMetrics, a European Commission 6th Framework Programme-
funded research project. The main objective of FLOSSMETRICS is to construct, publish and …

The energy of all sensor nodes in wireless sensor networks is limited. For this reason,
providing a method of communication between nodes and network administrator to manage …

We present an end-to-end design of a built-in self-test (BIST) and BIST-based diagnosis
infrastructure for 3-D-stacked integrated circuits (ICs) that facilitates the use of BIST at …

Using debug experiments to prove the concept, we correlated failures in the MRC training
log with board defects and, in doing so, established a new usage model for MRC board …

LBIST (Logic Built-In Self Test) is a structural test method that tests a circuit by running test
patterns generated on the die as opposed to ATPG (Automatic Test Pattern Generation) …

Defects cluster, and the probability of a multiple fault is significantly higher than just the
product of the single fault probabilities. While this observation is beneficial for high yield, it …

Efficient diagnosis procedures are crucial both for volume and for in-field diagnosis. In either
case the underlying test strategy should provide a high coverage of realistic fault …

Pseudo-exhaustive test completely verifies all output functions of a combinational circuit,
which provides a high coverage of non-target faults and allows an efficient on-chip …

When built-in test generation is used for a design that can be partitioned into logic blocks, it
is advantageous to identify groups of blocks whose tests have similar characteristics, and …

Functional broadside tests are two-patter scan-based tests that avoid over testing by
ensuring that a circuit traverses only reachable states during the functional clock cycles of a …