Physical unclonable functions (PUFs) have emerged as a promising security primitive for
low-cost authentication and cryptographic key generation. However, PUF stability with …

This paper presents a new design of dopingless dynamically configurable double-gate
tunnel FET (TFET) for process-voltage-temperature (PVT)-aware applications. The …

This paper presents an integrated framework, together with control policies, for optimizing
dynamic control of self-tuning parameters of a digital system over its lifetime in the presence …

We introduce two statistical methods for identifying recycled integrated circuits (ICs) through
the use of one-class classifiers and degradation curve sensitivity analysis. Both methods rely …

Tunnel field-effect transistors (TFETs) have extremely low leakage current, exhibit excellent
subthreshold swing, and are less susceptible to short-channel effects. However, TFETs do …

Ensuring lifetime reliability of microprocessors has become more critical. Continuous scaling
and increasing temperatures due to growing power density are threatening lifetime …

The performance of an IC degrades over its lifetime, ultimately resulting in IC failure. In this
article, we present a hardware attack (called MAGIC) to maliciously accelerate NBTI aging …

Estimating the aging-related degradation and failure of nanoscale integrated circuits (ICs),
before they actually occur, is crucial for developing aging prevention/mitigation actions and …

The proposed paper addresses the overarching reliability issue of transistor aging in
nanometer-scaled circuits. Specifically, a comprehensive survey and taxonomy of …

Moore's Law scaling is continuing to yield even higher transistor density with each
succeeding process generation, leading to today's multi-core Chip Multi-Processors (CMPs) …