The simulation of silicon-based light-emitting and photodetectors nanodevices using computer algebra became a challenge. These devices couple the hyperbolic equations of …
J Belhassen, A Chelly - IEEE Journal of Selected Topics in …, 2024 - ieeexplore.ieee.org
The fabrication of nanoelectronic and nanophotonic devices based on embedded quantum structures has become feasible over the last decades, and the field is continuously …
We compare two extraction methods based on the Y-function technique to extract the massive (> 100 kΩ) series resistance observed in SOI-MOSFET devices. A part the …
M Bendayan, Y Mandelbaum, G Teller… - Journal of Applied …, 2018 - pubs.aip.org
In the efforts to address the need for developing ultra-fast computers based on combined electronic and optical signal processing using silicon-based nanoscale devices, new types …
A Karsenty, A Chelly - Active and Passive Electronic …, 2014 - Wiley Online Library
The respective transfer characteristics of the ultrathin body (UTB) and gate recessed channel (GRC) device, sharing same W/L ratio but having a channel thickness of 46 nm, and …
Nanoscale MOSFETs Gate-Recessed Channel (GRC) device with a silicon channel thickness (t SI) as low as 2.2 nm was first tested at room temperature for functionality check …
A Karsenty, A Chelly - Active and Passive Electronic …, 2015 - Wiley Online Library
Nanoscale Gate‐Recessed Channel (GRC) Fully Depleted‐(FD‐) SOI MOSFET device with a silicon channel thickness (tSi) as low as 2.2 nm was first tested at room temperature for …
A Karsenty, A Chelly - 2014 IEEE 28th Convention of Electrical …, 2014 - ieeexplore.ieee.org
Two kinds of Fully Depleted Silicon-On-Insulator (FD-SOI) MOSFETs were electrically measured at 300K and at 77K and compared. Both the devices, Ultra-Thin Body (UTB) and …
Nanoscale Gate-Recessed Channel (GRC) Fully Depleted-(FD-) SOI MOSFET device with a silicon channel thickness (𝑡Si) as low as 2.2 nm was first tested at room temperature for …