[HTML][HTML] A Comprehensive Review of Nanoscale MOS Capacitors Applications in Photonics

M Levi, A Chelly, A Karsenty - Reviews in Physics, 2025 - Elsevier
Abstract Nanoscale Metal-Oxide-Semiconductor (MOS) capacitors have emerged as
versatile building blocks in photonics, enabling a wide range of applications, from optical …

Computer algebra challenges in nanotechnology: accurate modeling of nanoscale electro-optic devices using finite elements method

A Karsenty, Y Mandelbaum - Mathematics in Computer Science, 2019 - Springer
The simulation of silicon-based light-emitting and photodetectors nanodevices using
computer algebra became a challenge. These devices couple the hyperbolic equations of …

Review of Selected Quantum Measurements Applied to Embedded Quantum Well in Nanoscale Transistor

J Belhassen, A Chelly - IEEE Journal of Selected Topics in …, 2024 - ieeexplore.ieee.org
The fabrication of nanoelectronic and nanophotonic devices based on embedded quantum
structures has become feasible over the last decades, and the field is continuously …

Application, modeling and limitations of Y-function based methods for massive series resistance in nanoscale SOI MOSFETs

A Karsenty, A Chelly - Solid-State Electronics, 2014 - Elsevier
We compare two extraction methods based on the Y-function technique to extract the
massive (> 100 kΩ) series resistance observed in SOI-MOSFET devices. A part the …

[HTML][HTML] Probing of quantum energy levels in nanoscale body SOI-MOSFET: Experimental and simulation results

M Bendayan, Y Mandelbaum, G Teller… - Journal of Applied …, 2018 - pubs.aip.org
In the efforts to address the need for developing ultra-fast computers based on combined
electronic and optical signal processing using silicon-based nanoscale devices, new types …

Y‐Function Analysis of the Low Temperature Behavior of Ultrathin Film FD SOI MOSFETs

A Karsenty, A Chelly - Active and Passive Electronic …, 2014 - Wiley Online Library
The respective transfer characteristics of the ultrathin body (UTB) and gate recessed
channel (GRC) device, sharing same W/L ratio but having a channel thickness of 46 nm, and …

Anomalous Kink Effect in Low-Dimensional Gate-Recessed Fully Depleted SOI MOSFET at Low Temperature

A Karsenty, A Chelly - Nano, 2015 - World Scientific
Nanoscale MOSFETs Gate-Recessed Channel (GRC) device with a silicon channel
thickness (t SI) as low as 2.2 nm was first tested at room temperature for functionality check …

Anomalous DIBL Effect in Fully Depleted SOI MOSFETs Using Nanoscale Gate‐Recessed Channel Process

A Karsenty, A Chelly - Active and Passive Electronic …, 2015 - Wiley Online Library
Nanoscale Gate‐Recessed Channel (GRC) Fully Depleted‐(FD‐) SOI MOSFET device with
a silicon channel thickness (tSi) as low as 2.2 nm was first tested at room temperature for …

Nanoscale thick FDSOI MOSFETs: A simple model of abnormal electrical behavior at low temperature

A Karsenty, A Chelly - 2014 IEEE 28th Convention of Electrical …, 2014 - ieeexplore.ieee.org
Two kinds of Fully Depleted Silicon-On-Insulator (FD-SOI) MOSFETs were electrically
measured at 300K and at 77K and compared. Both the devices, Ultra-Thin Body (UTB) and …

[PDF][PDF] Research Article Anomalous DIBL Effect in Fully Depleted SOI MOSFETs Using Nanoscale Gate-Recessed Channel Process

A Karsenty, A Chelly - 2015 - academia.edu
Nanoscale Gate-Recessed Channel (GRC) Fully Depleted-(FD-) SOI MOSFET device with a
silicon channel thickness (𝑡Si) as low as 2.2 nm was first tested at room temperature for …