As technology edges closer to fundamental limits, variations of process parameters,
operational voltage, and temperature (PVT variations) have to be accounted for. This paper …

Environmental temperature variations, as well as process variations, have a detrimental
effect on performance and reliability of embedded systems implemented with deep-sub …

The performance and reliability of Ultra-Low-Power (ULP) computing platforms are
adversely affected by environmental temperature and process variations. Mitigating the …

Process variation occurring during fabrication of complex VLSI devices induce uncertainties
in operation parameters (eg, supply voltage) to be applied to each device in order for it to fit …

由于在实际生产和工作过程中受到多种复杂因素的影响, 集成电路的关键路径会发生不确定的
变化. 这导致时序分析结果出现较大偏差, 芯片的硅前-硅后一致性难以保证. 为此 …

To overcome the increasing sensitivity to variability in nanoscale integrated circuits,
operation parameters (eg, supply voltage) are adapted in a customized way exclusively to …

Adaptive voltage scaling (AVS) has been used widely to compensate for process, voltage,
and temperature variations as well as power optimization of integrated circuits. The current …

In this paper, we propose using transition fault test patterns to perform adaptive voltage
scaling (AVS) as a low-cost alternative to process monitoring boxes (PMBs) while improving …

The downsizing of CMOS technology makes circuit performance more sensitive to on-chip
parameter variations. Previous proposed design-dependent ring oscillator (DDRO) method …

With the influence of various complex factors in actual manufacturing and working process,
post-silicon critical paths of integrated circuit would have uncertain change. It makes large …