Advances in ultrashallow doping of silicon

C Zhang, S Chang, Y Dan - Advances in Physics: X, 2021 - Taylor & Francis
Ultrashallow doping is required for both classical field-effect transistors in integrated circuits
and revolutionary quantum devices in quantum computing. In this review, we give a brief …

Spin read-out in atomic qubits in an all-epitaxial three-dimensional transistor

M Koch, JG Keizer, P Pakkiam, D Keith… - Nature …, 2019 - nature.com
The realization of the surface code for topological error correction is an essential step
towards a universal quantum computer,–. For single-atom qubits in silicon,,–, the need to …

Atom‐by‐atom fabrication of single and few dopant quantum devices

J Wyrick, X Wang, RV Kashid… - Advanced Functional …, 2019 - Wiley Online Library
Atomically precise fabrication has an important role to play in developing atom‐based
electronic devices for use in quantum information processing, quantum materials research …

Nondestructive imaging of atomically thin nanostructures buried in silicon

G Gramse, A Kölker, T Lim, TJZ Stock, H Solanki… - Science …, 2017 - science.org
It is now possible to create atomically thin regions of dopant atoms in silicon patterned with
lateral dimensions ranging from the atomic scale (angstroms) to micrometers. These …

Addressable electron spin resonance using donors and donor molecules in silicon

SJ Hile, L Fricke, MG House, E Peretz, CY Chen… - Science …, 2018 - science.org
Phosphorus donor impurities in silicon are a promising candidate for solid-state quantum
computing due to their exceptionally long coherence times and high fidelities. However …

Suppressing segregation in highly phosphorus doped silicon monolayers

JG Keizer, S Koelling, PM Koenraad, MY Simmons - ACS nano, 2015 - ACS Publications
Sharply defined dopant profiles and low resistivity are highly desired qualities in the
microelectronic industry, and more recently, in the development of an all epitaxial Si: P …

Quantifying atom-scale dopant movement and electrical activation in Si: P monolayers

X Wang, JA Hagmann, P Namboodiri, J Wyrick, K Li… - Nanoscale, 2018 - pubs.rsc.org
Advanced hydrogen lithography techniques and low-temperature epitaxial overgrowth
enable the patterning of highly phosphorus-doped silicon (Si: P) monolayers (ML) with …

Limits to metallic conduction in atomic-scale quasi-one-dimensional silicon wires

B Weber, H Ryu, YHM Tan, G Klimeck, MY Simmons - Physical Review Letters, 2014 - APS
The recent observation of ultralow resistivity in highly doped, atomic-scale silicon wires has
sparked interest in what limits conduction in these quasi-1D systems. Here we present …

Determining the quantum-coherent to semiclassical transition in atomic-scale quasi-one-dimensional metals

B Weber, MY Simmons - Physical Review B, 2016 - APS
Atomic-scale silicon wires, patterned by scanning tunneling microscopy (STM) and
degenerately doped with phosphorus (P), have attracted significant interest owing to their …

Lithography and doping in strained Si towards atomically precise device fabrication

WCT Lee, SR McKibbin, DL Thompson, K Xue… - …, 2014 - iopscience.iop.org
We investigate the ability to introduce strain into atomic-scale silicon device fabrication by
performing hydrogen lithography and creating electrically active phosphorus δ-doped silicon …