Testability and dependability of AI hardware: Survey, trends, challenges, and perspectives

F Su, C Liu, HG Stratigopoulos - IEEE Design & Test, 2023 - ieeexplore.ieee.org
Hardware realization of artificial intelligence (AI) requires new design styles and even
underlying technologies than those used in traditional digital processors or logic circuits …

[HTML][HTML] Resilience of deep learning applications: A systematic literature review of analysis and hardening techniques

C Bolchini, L Cassano, A Miele - Computer Science Review, 2024 - Elsevier
Abstract Machine Learning (ML) is currently being exploited in numerous applications, being
one of the most effective Artificial Intelligence (AI) technologies used in diverse fields, such …

Radiation-tolerant deep learning processor unit (DPU)-based platform using Xilinx 20-nm kintex UltraScale FPGA

P Maillard, YP Chen, J Vidmar, N Fraser… - … on Nuclear Science, 2022 - ieeexplore.ieee.org
This article presents a platform and design appr-oach for enabling radiation-tolerant deep
learning acceleration on static random access memory (SRAM)-based 20-nm Kintex …

BEBERT: Efficient and robust binary ensemble BERT

J Tian, C Fang, H Wang, Z Wang - ICASSP 2023-2023 IEEE …, 2023 - ieeexplore.ieee.org
Pre-trained BERT models have achieved impressive accuracy on natural language
processing (NLP) tasks. However, their excessive amount of parameters hinders them from …

Special session: Fault-tolerant deep learning: A hierarchical perspective

C Liu, Z Gao, S Liu, X Ning, H Li… - 2022 IEEE 40th VLSI Test …, 2022 - ieeexplore.ieee.org
With the rapid advancements of deep learning in the past decade, it can be foreseen that
deep learning will be continuously deployed in more and more safety-critical applications …

Statistical modeling of soft error influence on neural networks

H Huang, X Xue, C Liu, Y Wang, T Luo… - … on Computer-Aided …, 2023 - ieeexplore.ieee.org
Soft errors in large VLSI circuits have a significant impact on computing-and memory-
intensive neural network (NN) processing. Understanding the influence of soft errors on NNs …

Resilience of Deep Learning applications: a systematic survey of analysis and hardening techniques

C Bolchini, L Cassano, A Miele - arXiv preprint arXiv:2309.16733, 2023 - arxiv.org
Machine Learning (ML) is currently being exploited in numerous applications being one of
the most effective Artificial Intelligence (AI) technologies, used in diverse fields, such as …

Efficient diverse redundant DNNs for autonomous driving

M Caro, J Fornt, J Abella - 2023 IEEE 47th Annual Computers …, 2023 - ieeexplore.ieee.org
Automotive applications with safety requirements must adhere to specific regulations such
as ISO 26262, which imposes the use of diverse redundancy for the highest integrity levels …

Ensemble-based Reliability Enhancement for Edge-Deployed CNNs in Few-shot Scenarios

Z Gao, S Liu, J Zhao, X Wang… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
Convolutional Neural Networks (CNNs) have been applied in wide areas of computer vision,
and edge intelligence is expected to provide instant AI service with the support of broadband …

Systematic reliability evaluation of FPGA implemented CNN accelerators

Z Gao, S Gao, Y Yao, Q Liu, S Zeng… - … on Device and …, 2023 - ieeexplore.ieee.org
Convolutional neural networks (CNN) have become essential for many scientific and
industrial applications, such as image classification and pattern detection. Among the …