Objects undergoing processing by a high resolution X-ray microscope with a high flux X-ray
source that allows high speed metrology or inspection of objects such as integrated circuits …

The present invention provides a number of innovations in the area of computational
process control (CPC). CPC offers unique diagnostic capability during chip manufacturing …

(57) ABSTRACT A statistical on-chip variation approach to timing analysis permits the
automated or semi-automated selection of design specific margins without requiring …

US10521538B2 - Method and system for integrated circuit design with on-chip variation and
spatial correlation - Google Patents US10521538B2 - Method and system for integrated …

BACKGROUND The performance of integrated circuits typically exhibits statistical
fluctuations due to process variations during the manufacturing processes. Devices and …

7.844. 418 B2 11/2010 Hemmett et al. 702/179 2009/0204367 A1 ck 8, 2009 Hemmett et
al.............. 702/179 8,065.12. 4 B2* 11, 2011 Xuetal TO3/6 2010.0045692 A1 2/2010 …

(57) ABSTRACT A check for determining the appropriateness of physical design data is
provided, where the check includes both a physical component and a logical component …

BACKGROUND A wide variety of design and computer-aided methods are utilized to
implement state-of-the art electronic systems. Among the many tasks allotted to the design …

BACKGROUND The subject matter disclosed herein relates to solutions for modeling
objects in the design of integrated circuits. More specifically, the subject matter disclosed …

US PATENT DOCUMENTS desired design of the one or more printed features. The error
function takes into account parameters (po... p.) from across the process window in addition …