Electron energy‐loss near‐edge structure (ELNES) is a technique that can be used to
measure the electronic structure (ie bonding) in materials with subnanometre spatial …

Interfaces such as grain boundaries (GBs) and heterointerfaces (HIs) are known to play a
crucial role in structure-property relationships of polycrystalline materials. While several …

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard
analytical technique used in the transmission electron microscope to extract chemical and …

This paper defines a new concept in EELS digital acquisition and processing: the spectrum-
image. This is a 3D array of nxnxs numbers, the first two axes of which correspond to the x …

Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the
analysis of thin samples of material. The technique is used in many modern transmission …

This completely revised and expanded new edition covers the full range of techniques now
available for the investigation of materials structure and accurate quantitative determination …

Electron energy-loss spectroscopy (EELS) in the scanning transmission electron microscope
(STEM) is a powerful method for analyzing elemental, chemical, dielectric, and other …

Precision and accuracy of quantitative scanning transmission electron microscopy (STEM)
methods such as ptychography, and the mapping of electric, magnetic, and strain fields …

The origins and the recent accomplishments of aberration correction in scanning
transmission electron microscopy (STEM) are reviewed. It is remembered that the successful …

Valence electron energy loss spectroscopy (EELS) has been used to characterize the
composition of frozen-hydrated specimens in the electron microscope. Fine structure in the …