Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends

V Miikkulainen, M Leskelä, M Ritala… - Journal of Applied …, 2013 - pubs.aip.org
Atomic layer deposition (ALD) is gaining attention as a thin film deposition method, uniquely
suitable for depositing uniform and conformal films on complex three-dimensional …

The use of atomic layer deposition in advanced nanopatterning

AJM Mackus, AA Bol, WMM Kessels - Nanoscale, 2014 - pubs.rsc.org
Atomic layer deposition (ALD) is a method that allows for the deposition of thin films with
atomic level control of the thickness and an excellent conformality on 3-dimensional …

The rectenna device: From theory to practice (a review)

E Donchev, JS Pang, PM Gammon… - MRS Energy & …, 2014 - cambridge.org
This review article provides the state-of-art research and developments of the rectenna
device and its two main components–the antenna and the rectifier. Furthermore, the history …

Oxide electronics by spatial atomic layer deposition

DH Levy, SF Nelson, D Freeman - Journal of Display Technology, 2009 - opg.optica.org
We report on zinc oxide (ZnO)-based devices produced by a fast, open-air atomic layer
deposition (ALD) process relying upon the spatial isolation of reactive gases. At deposition …

Trends in copper precursor development for CVD and ALD applications

PG Gordon, A Kurek, ST Barry - ECS Journal of Solid State …, 2014 - iopscience.iop.org
The continued dominance of copper in microelectronic manufacturing is due in part to the
techniques that have kept pace with the relentless trend towards smaller feature sizes. Pure …

Gap size dependence of the dielectric strength in nano vacuum gaps

D Lyon, A Hubler - IEEE Transactions on Dielectrics and …, 2013 - ieeexplore.ieee.org
We study the dielectric strength of vacuum gaps of under 100 nm. We find their dielectric
strengths to have a power law dependence on the gap size. We apply this power law to find …

Nanoscale devices for rectification of high frequency radiation from the infrared through the visible: a new approach

NM Miskovsky, PH Cutler, A Mayer… - Journal of …, 2012 - Wiley Online Library
We present a new and viable method for optical rectification. This approach has been
demonstrated both theoretically and experimentally and is the basis fot the development of …

Low-Temperature Atomic Layer Deposition of Low-Resistivity Copper Thin Films Using Cu(dmap)2 and Tertiary Butyl Hydrazine

K Väyrynen, K Mizohata, J Räisänen… - Chemistry of …, 2017 - ACS Publications
Herein, we describe a process for the low-temperature atomic layer deposition of copper
using Cu (dmap) 2 (dmap= dimethylamino-2-propoxide). The use of tertiary butyl hydrazine …

Area-selective atomic layer deposition using an inductively coupled plasma polymerized fluorocarbon layer: a case study for metal oxides

A Haider, P Deminskyi, TM Khan, H Eren… - The Journal of …, 2016 - ACS Publications
Area-selective atomic layer deposition (AS-ALD) has attracted immense attention in recent
years for self-aligned accurate pattern placement with subnanometer thickness control …

Nanoscale selective area atomic layer deposition of TiO 2 using e-beam patterned polymers

A Haider, M Yilmaz, P Deminskyi, H Eren, N Biyikli - RSC advances, 2016 - pubs.rsc.org
Here, we report nano-patterning of TiO2 via area selective atomic layer deposition (AS-ALD)
using an e-beam patterned growth inhibition polymer. Poly (methylmethacrylate)(PMMA) …