[HTML][HTML] 电子探针分析技术进展及面临的挑战
张迪， 陈意， 毛骞， 苏斌， 贾丽辉， 郭顺 - 岩石学报, 2019 - html.rhhz.net
电子探针是研究地球与行星物质组成最基础的微束分析技术. 近年来, 固体地球科学和行星科学
的不断发展, 促使电子探针分析技术取得了一系列进展: 矿物微量元素分析 …
的不断发展, 促使电子探针分析技术取得了一系列进展: 矿物微量元素分析 …
Seeing through metamorphic overprints in Archean granulites: Combined high-resolution thermometry and phase equilibrium modeling of the Lewisian Complex …
Abstract The Lewisian Complex in northwest Scotland presents a record of the transition
from the Neo-Archean to the Paleoproterozoic. However, this record is complicated by a …
from the Neo-Archean to the Paleoproterozoic. However, this record is complicated by a …
Electron probe microanalysis of Ni silicides using Ni-L X-ray lines
We report electron probe microanalysis measurements on nickel silicides, Ni5Si2, Ni2Si,
Ni3Si2, and NiSi, which were done in order to investigate anomalies that affect the analysis …
Ni3Si2, and NiSi, which were done in order to investigate anomalies that affect the analysis …
Electron probe microanalysis of carbon containing steels at a high spatial resolution
Für die Entwicklung neuer hochfester Stähle und ihrer Herstellungsverfahren benötigt man
eine chemische Charakterisierung von Strukturen auf der Submikrometer Skala. Strukturen …
eine chemische Charakterisierung von Strukturen auf der Submikrometer Skala. Strukturen …
[图书][B] Electron probe sub-micron analysis in geoscience: Problems and potential solutions of low voltage electron microprobe analysis, as applied to reduced lunar …
PN Gopon - 2016 - search.proquest.com
Conventional electron-probe microanalysis (EPMA) has an X-ray analytical spatial
resolution on the order of 1-4 μm width/depth. Many of the naturally occurring Fe-Si …
resolution on the order of 1-4 μm width/depth. Many of the naturally occurring Fe-Si …
Solving the iron quantification problem in low-kV EPMA: An essential step toward improved analytical spatial resolution in electron probe microanalysis—Fe-sulfides
A Moy, A Handt, J Fournelle - American Mineralogist, 2022 - degruyter.com
The use of the field emission gun in scanning electron microscopy permits the imaging of
sub-micrometer-size features. However, achieving sub-micrometer analytical spatial …
sub-micrometer-size features. However, achieving sub-micrometer analytical spatial …