T Moposita, E Holguín - 2024 IEEE Eighth Ecuador Technical …, 2024 - ieeexplore.ieee.org
This paper explores the impact on reliability and energy-efficiency in double-barrier magnetic tunnel junctions (DMTJs)-based smart material implication (SIMPLY) scheme …
M Lanuzza, T Moposita - 2024 IEEE 24th International …, 2024 - ieeexplore.ieee.org
Logic-in-Memory (LIM) architectures, particularly those based on Spin-Transfer Torque Magnetic Random-Access Memory (STT-MRAM), offer a promising solution to over-come …