▪ Abstract This paper reviews the literature on size effects in ferroelectric materials, with an emphasis on thin film perovskite ferroelectrics. The roles of boundary conditions, defect …
Electroceramics research is driven by technology and device applications. This growing field includes a vast number of magnetic, dielectric, ionically conducting, semiconducting, and …
TiO2 thin films with high dielectric constants (83–100) were grown on a Ru electrode at a growth temperature of 250 C using the atomic-layer deposition method. The as-deposited …
SK Kim, GJ Choi, SY Lee, M Seo, SW Lee… - Advanced …, 2008 - Wiley Online Library
Dynamic random access memory (DRAM) is used as the main memory of every modern computer, due to its high density, high speed and efficient memory function. Each DRAM cell …
JA Kittl, K Opsomer, M Popovici, N Menou… - Microelectronic …, 2009 - Elsevier
The requirements and development of high-k dielectric films for application in storage cells of future generation flash and Dynamic Random Access Memory (DRAM) devices are …
SK Kim, SW Lee, JH Han, B Lee, S Han… - Advanced Functional …, 2010 - Wiley Online Library
The recent progress in the metal‐insulator‐metal (MIM) capacitor technology is reviewed in terms of the materials and processes mostly for dynamic random access memory (DRAM) …
S Ezhilvalavan, TY Tseng - Materials Chemistry and Physics, 2000 - Elsevier
This paper reviews the recent developments of (Ba, Sr) TiO3 (BST) thin films for future Gbit era dynamic random access memory (DRAM) applications. The trends of DRAM capacitors …
JF Scott - Annual review of materials science, 1998 - annualreviews.org
▪ Abstract We discuss high-dielectric films, in general, oxide ferroelectrics based on simple perovskite structures and related Aurivillius-phase layered structure perovskites employed …
Ultrathin films with high-k dielectric/ferroelectric properties form the basis of modern electronics. With further miniaturization of electronic devices, conventional materials are …