Owing to the lack of feasible fault modeling method, hard (open and short) faults, and
discretized parametric faults are still the mostly used fault models. These models cannot …

Methods for testing both parametric and catastrophic faults in analog and mixed-signal
circuits are presented. They are based on the wavelet transform (WT) of the measured …

This paper proposes a new decision tree approach for analog circuit fault diagnosis using
binary support vector machines (BSVMs) that are trained by using different data sets. To …

Owing to the lack of feasible fault modeling method, hard (open and short) faults and
discrete parameter faults are still the mostly used fault models. These models cannot …

Partial discharge (PD) is caused by the localised electrical field intensification in insulating
materials. Early detection and accurate measurement of PD are very important for …

This paper presents a novel strategy of fault classification for the analog circuit under test
(CUT). The proposed classification strategy is implemented with the one-against-one …

Although most of the integrated circuits in everyday applications surrounding us are digital,
analog electronic circuits are still necessary, since the real world is" analog" and our human …

In this paper, wavelet-transform-based time–frequency domain reflectometry (WTFDR) is
proposed for load impedance measurement. In order to measure the load impedance, the …

Analog circuits contribute to as much test cost as digital circuits. Traditional model-based
testing (eg catastrophic, range-based, regression models) had limited success due to …

In this paper a test method for testing both parametric and catastrophic faults in analog and
mixed signal Integrated Circuits (ICs) is presented. It is based on the wavelet transformation …