The impact of random dopant fluctuation (RDF), work function variation (WFV) and oxide thickness fluctuation (OTF) on the statistical variability of the electrical performance of non …
In this paper, an n-channel junctionless FinFET (JL FinFET) based on a silicon-on-insulator (SOI) architecture with a buried metal fin (BMF) is presented. We show that the BMF with a …
DK Singh, BC Nagar, MW Akram - 2021 - researchsquare.com
In this paper, an n-channel junctionless FET (JLFET) based on SOI with a buried metal fin (BMF) is presented. We show that the BMF of suitable workfunction of the proposed device …