Starting with a basic overview of system-on-a-chip (SoC), including definitions of related
terms, this new book helps you understand SoC design challenges, and the latest design …

In the last years the technology improvements of Digital-to-Analog Converters (DACs) has
extended the use of digital techniques in a multitude of applications. Consequently, there is …

In this paper, a new built-in self-test structure to test the static specifications of analog to
digital converters (ADCs) is presented. A ramp signal generated by an integrator serves as a …

In order to assess the performance of digital-to-analog converters (DAC) the attention is
generally focused on the integral nonlinearity INL. Useful diagnostic tools to detect the …

A transition-code based method is proposed to reduce the linearity testing time of pipelined
analog-to-digital converters (ADCs). By employing specific architecture-dependent rules …

In this paper, we have proposed a new high precision ramp waveform generator for low cost
ADC test. With proposed test method combined with histogram analysis, an ADC can be …

A design-for-digital-testability (DfDT) switched-capacitor circuit structure for testing Sigma-
Delta modulators with digital stimuli is presented to reduce the overall testing cost. In the test …

In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal
circuits that is intended to provide on-chip stimulus generation and response analysis …

The analog built-in self-test (BIST) scheme, with stimulus generation and response
extraction based on the/spl Sigma/-/spl Delta/modulation, is proven to be quite effective for …

This paper demonstrates the first fully integrated built-in self-test (BIST) Σ-Δ analog-to-digital
converter (ADC) chip to the best of our knowledge. The ADC under test (AUT) comprises a …