Electronics and packaging intended for emerging harsh environment applications: A review

A Hassan, Y Savaria, M Sawan - IEEE transactions on very …, 2018 - ieeexplore.ieee.org
Several industrial applications require specific electronic systems installed in harsh
environments to perform measurements, monitoring, and control tasks such as in space …

On the potential of SiGe HBTs for extreme environment electronics

JD Cressler - Proceedings of the IEEE, 2005 - ieeexplore.ieee.org
" Extreme environments" represents an important niche market for electronics and spans the
operation of electronic components in surroundings lying outside the domain of …

[图书][B] Silicon Heterostructure Handbook: Materials, Fabrication, Devices, Circuits and Applications of SiGe and Si Strained-Layer Epitaxy

JD Cressler, S Monfray, G Freeman, D Friedman… - 2018 - taylorfrancis.com
An extraordinary combination of material science, manufacturing processes, and innovative
thinking spurred the development of SiGe heterojunction devices that offer a wide array of …

Radiation effects in SiGe technology

JD Cressler - IEEE transactions on Nuclear Science, 2013 - ieeexplore.ieee.org
Silicon-Germanium (SiGe) technology effectively merges the desirable attributes of
conventional silicon-based CMOS manufacturing (high integration levels, at high yield and …

A new" mixed-mode" reliability degradation mechanism in advanced Si and SiGe bipolar transistors

G Zhang, JD Cressler, G Niu… - IEEE Transactions on …, 2002 - ieeexplore.ieee.org
A new mixed-mode base current degradation mechanism is identified in bipolar transistors
for the first time, which, at room temperature, induces a large I/sub B/leakage current only …

Emerging SiGe HBT reliability issues for mixed-signal circuit applications

JD Cressler - IEEE Transactions on Device and Materials …, 2004 - ieeexplore.ieee.org
We review the emerging reliability issues associated with high-performance SiGe HBT
technologies which are being increasingly deployed in a wide variety of mixed-signal circuit …

Investigation of single-event transients in voltage-controlled oscillators

W Chen, V Pouget, HJ Barnaby… - IEEE transactions on …, 2003 - ieeexplore.ieee.org
The responses of voltage-controlled oscillators (VCOs) to single-event transients (SETs) are
investigated. Laser testing and simulations indicate that ion strikes on critical transistors …

An investigation of the origins of the variable proton tolerance in multiple SiGe HBT BiCMOS technology generations

JD Cressler, R Krithivasan, G Zhang… - … on Nuclear Science, 2002 - ieeexplore.ieee.org
This paper presents the first investigation of the physical origins of the observed variable
proton tolerance in multiple SiGe HBT BiCMOS technology generations. We use the …

The impact of technology scaling on the single-event transient response of SiGe HBTs

NE Lourenco, ZE Fleetwood, A Ildefonso… - … on Nuclear Science, 2016 - ieeexplore.ieee.org
The impact of semiconductor process scaling on the overall transient response of SiGe
BiCMOS platforms is investigated. Pulsed-laser two-photon absorption (TPA) and heavyion …

An 8–16 GHz SiGe low noise amplifier with performance tuning capability for mitigation of radiation-induced performance loss

DC Howard, PK Saha, S Shankar… - IEEE transactions on …, 2012 - ieeexplore.ieee.org
We present a wideband, low noise amplifier (LNA) implemented in a Silicon-Germanium
Heterojunction Bipolar Transistor (SiGe HBT) technology. This SiGe LNA covers a frequency …