A diagnostic automatic test pattern generation (DATPG) system is constructed by adding
new algorithmic capabilities to conventional ATPG and fault simulation programs. The …

Diagnosis of each failed part requires the failed data captured on the test equipment.
However, due to memory limitations on the tester, one often cannot store all the failed data …

This paper presents a diagnostic test generation method for transition faults. As two
consecutive vectors application mechanism, launch on capture test is considered. The …

To distinguish between a pair of transition faults, we need to find a test vector pair (LOC or
LOS type) that produces different output responses for the two faults. By adding a few logic …

In diagnostic testing faults detectable by test vectors are partitioned into groups. This
partitioning is such that a fault is distinguishable from faults in all other groups, but is …

Recent innovations in Test Compression are enabling implementation of very high
compression ratios. This paper analyzes the impact of high compression on resolution and …

By adding a few logic gates and one or two modeling flip-flops to the circuit under test (CUT),
we create a detection or diagnostic automatic test pattern generation (ATPG) model of …

In VLSI testing we need Automatic Test Pattern Generator (ATPG) to get input test vectors for
Circuit Under Test (CUT). Generated test sets are usually compacted to save test time which …

We propose techniques to speed up diagnostic fault simulation for circuits without full-scan
which may need multi-cycle tests. First, we introduce the concept of z-sets for circuits without …

Предложен метод аналитического конструирования цифровых устройств,
формирующих тесты произвольной конфигурации для контроля технического …