Atomic layer deposition of metal and nitride thin films: Current research efforts and applications for semiconductor device processing

H Kim - Journal of Vacuum Science & Technology B …, 2003 - pubs.aip.org
Atomic layer deposition (ALD) has been studied for several decades now, but the interest in
ALD of metal and nitride thin films has increased only recently, driven by the need for highly …

Interfacial toughness measurements for thin films on substrates

AA Volinsky, NR Moody, WW Gerberich - Acta materialia, 2002 - Elsevier
There are more than 200 different methods for measuring adhesion, suggesting it to be
material, geometry and even industry specific. This availability has exploded at least partly …

An overview on diamond-like carbon coatings in medical applications

R Hauert, K Thorwarth, G Thorwarth - Surface and Coatings Technology, 2013 - Elsevier
This overview article on diamond-like carbon (DLC) coatings in medical applications covers
the interaction of cells and tissue with DLC and alloyed DLC to generate desired cell …

Impact of near-surface thermal stresses on interfacial reliability of through-silicon vias for 3-D interconnects

SK Ryu, KH Lu, X Zhang, JH Im, PS Ho… - IEEE Transactions on …, 2010 - ieeexplore.ieee.org
Continual scaling of on-chip wiring structures has brought significant challenges for
materials and processes beyond the 32-nm technology node in microelectronics. Recently …

Relationship between interfacial adhesion and electromigration in Cu metallization

MW Lane, EG Liniger, JR Lloyd - Journal of Applied Physics, 2003 - pubs.aip.org
A relationship between the adhesion of a Cu conductor to its surrounding medium, the
electromigration drift velocity, and lifetime in a conventional electromigration test has been …

Magnetron sputter deposited tantalum and tantalum nitride thin films: An analysis of phase, hardness and composition

D Bernoulli, U Müller, M Schwarzenberger, R Hauert… - Thin Solid Films, 2013 - Elsevier
Tantalum (Ta) and tantalum nitride thin films are highly important as diffusion barriers and
adhesion layers in microelectronics and hard coatings for cutting tools. In this study, the …

[图书][B] Comprehensive structural integrity: Cyclic loading and fatigue

I Milne, RO Ritchie, BL Karihaloo - 2003 - books.google.com
Cyclic fatigue, ie, delayed failure under cyclically varying loads, is the most pervasive, yet
least understood, form of fracture, accounting for 80% or more of all" in-service" failures. It is …

Plasticity contributions to interface adhesion in thin-film interconnect structures

M Lane, RH Dauskardt, A Vainchtein… - Journal of materials …, 2000 - cambridge.org
The effects of plasticity in thin copper layers on the interface fracture resistance in thin-film
interconnect structures were explored using experiments and multiscale simulations …

Integrated circuit packaging review with an emphasis on 3D packaging

A Lancaster, M Keswani - Integration, 2018 - Elsevier
An introduction to the exciting and continuously growing topic of IC packaging is presented
herein. This review starts with a beginner's level introduction to microelectronic packaging …

Adhesion–delamination phenomena at the surfaces and interfaces in microelectronics and MEMS structures and packaged devices

VK Khanna - Journal of Physics D: Applied Physics, 2010 - iopscience.iop.org
Physico-chemical mechanisms of adhesion and debonding at the various surfaces and
interfaces of semiconductor devices, integrated circuits and microelectromechanical systems …