Lead zirconate titanate Pb (Zr 0.50 Ti 0.50) O 3 (PZT) thin films were deposited by a
polymeric chemical method on Pt (111)/Ti/SiO 2/Si substrates to understand the …

This work demonstrates the existence of a self-polarization effect in Pb (Zr0. 50Ti0. 50) O3
thin films with no preferential orientation. Piezoresponse Force Microscopy (PFM) and …

Metal salts are a good alternative to metal alkoxides in the sol-gel process. Typically, metal
salts are less expensive, and, in some case, metal alkoxides are not available for the …

We report a study of residual stress in PbTiO 3 (PT) thin films prepared on Si substrates by a
polymeric chemical method. The E (1TO) frequency was used to evaluate the residual stress …

This work reports the effect of annealing temperature and frequency on dielectric and
ferroelectric properties of PZT thin films produced by oxide precursor method. The properties …

The structure and ferroelectric properties of PbZr 0.53 Ti 0.47 O 3 thin films were
investigated in detail by using the x-ray diffraction technique. The surface morphology of the …

Lead zirconate titanate Pb (Zr0. 50Ti0. 50) O3 (PZT) thin films were deposited by a polymeric
chemical method on Pt (111)/Ti/SiO2/Si substrates to understand the mechanisms of phase …

This paper reports studies on dielectric and ferroelectric properties of lead zirconate titanate
(PZT) thin films crystallized by conventional thermal annealing (CTA) and rapid thermal …

Ferroelectric thin films of PZT, with a Zr/Ti molar ratio of 53/47, were prepared by a method
that uses oxides as precursors, and deposited on Pt/Si. Films of thickness were obtained …

The structural properties of Pb (Zr 0.50 Ti 0.50) O 3 thin films with no preferential orientation
were studied throughout the film thickness. An analysis on depth profile shows the existence …