Visible to near‐infrared photodiodes with advanced radiation resistance
A new type of sub‐micron metal‐intrinsic semiconductor‐metal visible to near‐infrared (400–
1600 nm) photodiodes based on a unique combination of radiation‐resistant functional …
1600 nm) photodiodes based on a unique combination of radiation‐resistant functional …
Study of Au/Hg3In2Te6 interface by synchrotron radiation photoemission spectroscopy
The Au/Hg 3 In 2 Te 6 interface was systematically investigated by synchrotron radiation
photoemission spectroscopy (SRPES). Before the Au film prepared, the effects of the Ar+ ion …
photoemission spectroscopy (SRPES). Before the Au film prepared, the effects of the Ar+ ion …
Growth, structure and electrical properties of mercury indium telluride single crystals
L Wang, Y Dong, W Jie - Journal of Physics D: Applied Physics, 2007 - iopscience.iop.org
A new zinc-blende type photoelectronic single crystal, Hg (3− 3x) In 2x Te 3 (MIT), was
grown by using the vertical Bridgman method. The structure of the MIT (x= 0.5) crystal was …
grown by using the vertical Bridgman method. The structure of the MIT (x= 0.5) crystal was …
HRTEM study on the ordered phases in Hg 3 In 2 Te 6 crystals grown by Bridgman method
L Luo, W Jie, Y Xu, Y He, L Xu, L Fu - CrystEngComm, 2014 - pubs.rsc.org
High-resolution transmission electron microscopy (HRTEM) is used to investigate
Hg3In2Te6 (MIT) crystals grown by the Bridgman method. The results show that at least two …
Hg3In2Te6 (MIT) crystals grown by the Bridgman method. The results show that at least two …
[PDF][PDF] 碲铟汞晶体的生长及其电学特性
王领航， 董阳春， 介万奇 - 2007 - jos.ac.cn
摘要利用垂直M< NCKIFJ 法成功生长了&KReRQ'J! Q4> R" 2'4#" Qb $ _Z# 单晶体! 并用X.
3!.,[X. 3 及霍尔测量对晶体的结晶质量及电学性能进行了研究8 结果表明 …
3!.,[X. 3 及霍尔测量对晶体的结晶质量及电学性能进行了研究8 结果表明 …
Study of thermal expansion of mercury indium telluride crystals by XRD technique
L Wang, WQ Jie - Transactions of Nonferrous Metals Society of China, 2009 - Elsevier
The thermal expansion behavior of mercury indium telluride (MIT) crystals, Hg (3–3x)
In2xTe3 (x= 0.5), based on X-ray diffraction experimental data is studied at 298–573 K. The …
In2xTe3 (x= 0.5), based on X-ray diffraction experimental data is studied at 298–573 K. The …
High temperature x-ray diffraction study on phase transformation and lattice thermal expansion of mercury indium telluride crystals
L Wang, W Jie, Y Yang, L Fu - Journal of Physics D: Applied …, 2008 - iopscience.iop.org
The high temperature properties of Hg (3− 3x) In 2x Te 3 (MIT)(x= 0.5) crystals grown by the
vertical Bridgman method were investigated. The high temperature x-ray diffraction patterns …
vertical Bridgman method were investigated. The high temperature x-ray diffraction patterns …