LA Bru, D Pastor, B Gargallo… - Proc. of European …, 2018 - ecio-conference.org
In this work we report on a fully integrated photonic chip test structure, providing optical amplitude and phase, frequency and time domain resolution for on-chip devices under test …
In this work, a novel characterization technique taking advantage of the maturity and high sensitivity of Fourier domain optical coherence tomography (FD-OCT). The method has …
En esta tesina fin de máster, se desarrollar procesos para oxidación de obleas de silicio y litografía y ataque de capas de nitruro de silicio. El estudiante realizará estos desarrollos …