Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends

V Miikkulainen, M Leskelä, M Ritala… - Journal of Applied …, 2013 - pubs.aip.org
Atomic layer deposition (ALD) is gaining attention as a thin film deposition method, uniquely
suitable for depositing uniform and conformal films on complex three-dimensional …

Plasma-assisted atomic layer deposition: basics, opportunities, and challenges

HB Profijt, SE Potts, MCM Van de Sanden… - Journal of Vacuum …, 2011 - pubs.aip.org
Plasma-assisted atomic layer deposition (ALD) is an energy-enhanced method for the
synthesis of ultra-thin films with Å-level resolution in which a plasma is employed during one …

Development of hafnium based high-k materials—A review

JH Choi, Y Mao, JP Chang - Materials Science and Engineering: R: Reports, 2011 - Elsevier
The move to implement metal oxide based gate dielectrics in a metal-oxide-semiconductor
field effect transistor is considered one of the most dramatic advances in materials science …

Deposition of TiN and HfO2 in a commercial 200mm remote plasma atomic layer deposition reactor

SBS Heil, JL Van Hemmen, CJ Hodson… - Journal of Vacuum …, 2007 - pubs.aip.org
The authors describe a remote plasma atomic layer deposition reactor (Oxford Instruments
FlexAL™) that includes an inductively coupled plasma source and a load lock capable of …

In situ spectroscopic ellipsometry study on the growth of ultrathin TiN films by plasma-assisted atomic layer deposition

E Langereis, SBS Heil, MCM Van De Sanden… - Journal of applied …, 2006 - pubs.aip.org
The growth of ultrathin TiN films by plasma-assisted atomic layer deposition (PA-ALD) was
studied by in situ spectroscopic ellipsometry (SE). In between the growth cycles consisting of …

Advanced atomic layer deposition: metal oxide thin film growth using the discrete feeding method

JC Park, CI Choi, SG Lee, SJ Yoo, JH Lee… - Journal of Materials …, 2023 - pubs.rsc.org
A HfO2 film was grown via atomic layer deposition (ALD) with a discrete feeding method
(DFM), called DF-ALD, and its physical, chemical, and electrical properties were studied. In …

Comparison between thermal and plasma enhanced atomic layer deposition processes for the growth of HfO2 dielectric layers

RL Nigro, E Schilirò, G Mannino, S Di Franco… - Journal of Crystal …, 2020 - Elsevier
In this work, hafnium oxide (HfO 2) thin films have been grown on (0 0 1) Si substrates by
two different Atomic Layer Deposition (ALD) methods, namely thermal and plasma …

Multiscale computational fluid dynamics modeling and reactor design of plasma-enhanced atomic layer deposition

Y Zhang, Y Ding, PD Christofides - Computers & Chemical Engineering, 2020 - Elsevier
Plasma-enhanced atomic layer deposition (PEALD) is one of the most widely adopted
deposition methods in the semiconductor industry. It is chosen largely due to its superior …

SONOS-type flash memory using an HfO/sub 2/as a charge trapping layer deposited by the sol-gel spin-coating method

HC You, TH Hsu, FH Ko, JW Huang… - IEEE Electron device …, 2006 - ieeexplore.ieee.org
In this letter, the authors fabricate the silicon-oxide-nitride-oxide-silicon (SONOS)-like
memory using an HfO 2 as charge trapping layer deposited by a very simple sol-gel spin …

Machine learning-based modeling and operation of plasma-enhanced atomic layer deposition of hafnium oxide thin films

Y Ding, Y Zhang, HY Chung, PD Christofides - Computers & Chemical …, 2021 - Elsevier
Plasma-enhanced atomic layer deposition (PEALD) has demonstrated its superiority at
coating ultra-conformal high dielectric thin-films, which are essential to the fin field-effect …