V Damnjanović, VP Ponomarenko… - … science and technology, 2008 - iopscience.iop.org
The photo-electric characteristics of tunnel MIS photo-detectors based on Hg 1− x Cd x Te for x≈ 0.2 are presented. In order to reduce or eliminate Fermi level pinning, a passivation …
ZY Zhang, R Irwan, H Huang - Key Engineering Materials, 2010 - Trans Tech Publ
Surface characteristics of CZT wafers machined using wire sawing, free abrasives lapping and polishing and ultra-precision grinding were investigated. Wire sawing resulted in the …
Mechanical properties, deformation and material removal characteristics of two II-VI semiconductor compounds, mercury cadmium telluride (HgCdTe) and cadmium zinc …
It is usually believed that the over-the-barrier current in Schottky barriers (SB) on p-type semiconductor is controlled by heavy holes. However, there is an additional potential barrier …
V Damnjanović, JM Elazar - 2010 27th International …, 2010 - ieeexplore.ieee.org
In this paper we describes technological processes for the stabilization of interface between p-Hg 1-x Cd x and dielectric. Native oxide and native fluoride, as well as Al 2 O 3 and SiO 2 …