T Nakayama, O Kubo, Y Shingaya, S Higuchi… - Advanced …, 2012 - Wiley Online Library
In the research of advanced materials based on nanoscience and nanotechnology, it is often desirable to measure nanoscale local electrical conductivity at a designated position of a …
T Nakayama, Y Shingaya, M Aono - Japanese Journal of Applied …, 2016 - iopscience.iop.org
Nanoarchitectonic systems are of interest for utilizing a vast range of nanoscale materials for future applications requiring a huge number of elemental nanocomponents. To explore the …
A Kaneta, R Fujimoto, T Hashimoto… - Review of Scientific …, 2012 - pubs.aip.org
To investigate local carrier motions, we developed a dual-probe scanning near-field optical microscope (SNOM) with two fiber probes where one is for photoexcitation and the other is …
E Tsunemi, K Kobayashi, K Matsushige… - Review of Scientific …, 2011 - pubs.aip.org
We developed a dual-probe (DP) atomic force microscopy (AFM) system that has two independently controlled probes. The deflection of each cantilever is measured by the …
S Higuchi, O Kubo, H Kuramochi, M Aono… - …, 2011 - iopscience.iop.org
Four-terminal electrical measurement is realized on a microscopic structure in air, without a lithographic process, using a home-built quadruple-scanning-probe force microscope …
P Li, Y Shao, K Xu, X Qiu - Review of Scientific Instruments, 2021 - pubs.aip.org
We developed a multi-probe atomic force microscope (MP-AFM) system with up to four probes and realized various functions such as topography mapping, probing electrical …
K Wang, J Shi, T Yang, S Tang, P Yu, H Shi… - Review of Scientific …, 2023 - pubs.aip.org
The diversity of functional applications of atomic force microscopes is the key to the development of nanotechnology. However, the single probe configuration of the traditional …
F Iwata, Y Mizuguchi, K Ozawa… - Japanese Journal of …, 2010 - iopscience.iop.org
We describe a novel and simple operation method of using a self-sensitive cantilever of an atomic force microscopy (AFM) system in liquid. As for operation of the cantilever in liquid, Al …
Design and modeling of a class of scanning near-field optical microscope (SNOM) probe for improving performance are reported. The basic idea is to generate more than one hot spot …