Synchronous identification and successive detection of multiple traces with tunable coupling oscillators

C Xia, DF Wang, J Song, T Ono, T Itoh, R Maeda… - … Systems and Signal …, 2022 - Elsevier
Trace identification and detection of toxic, flammable, explosive substances, pollen
allergens, as well as biological viruses is crucial for public health and safety, chemic …

Development and application of multiple‐probe scanning probe microscopes

T Nakayama, O Kubo, Y Shingaya, S Higuchi… - Advanced …, 2012 - Wiley Online Library
In the research of advanced materials based on nanoscience and nanotechnology, it is often
desirable to measure nanoscale local electrical conductivity at a designated position of a …

Multiple-probe scanning probe microscopes for nanoarchitectonic materials science

T Nakayama, Y Shingaya, M Aono - Japanese Journal of Applied …, 2016 - iopscience.iop.org
Nanoarchitectonic systems are of interest for utilizing a vast range of nanoscale materials for
future applications requiring a huge number of elemental nanocomponents. To explore the …

Instrumentation for dual-probe scanning near-field optical microscopy

A Kaneta, R Fujimoto, T Hashimoto… - Review of Scientific …, 2012 - pubs.aip.org
To investigate local carrier motions, we developed a dual-probe scanning near-field optical
microscope (SNOM) with two fiber probes where one is for photoexcitation and the other is …

Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams

E Tsunemi, K Kobayashi, K Matsushige… - Review of Scientific …, 2011 - pubs.aip.org
We developed a dual-probe (DP) atomic force microscopy (AFM) system that has two
independently controlled probes. The deflection of each cantilever is measured by the …

A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials

S Higuchi, O Kubo, H Kuramochi, M Aono… - …, 2011 - iopscience.iop.org
Four-terminal electrical measurement is realized on a microscopic structure in air, without a
lithographic process, using a home-built quadruple-scanning-probe force microscope …

Development of a multi-functional multi-probe atomic force microscope system with optical beam deflection method

P Li, Y Shao, K Xu, X Qiu - Review of Scientific Instruments, 2021 - pubs.aip.org
We developed a multi-probe atomic force microscope (MP-AFM) system with up to four
probes and realized various functions such as topography mapping, probing electrical …

An integrated hinged dual-probe for co-target fast switching imaging

K Wang, J Shi, T Yang, S Tang, P Yu, H Shi… - Review of Scientific …, 2023 - pubs.aip.org
The diversity of functional applications of atomic force microscopes is the key to the
development of nanotechnology. However, the single probe configuration of the traditional …

Operation of self-sensitive cantilever in liquid for multiprobe manipulation

F Iwata, Y Mizuguchi, K Ozawa… - Japanese Journal of …, 2010 - iopscience.iop.org
We describe a novel and simple operation method of using a self-sensitive cantilever of an
atomic force microscopy (AFM) system in liquid. As for operation of the cantilever in liquid, Al …

Dual-color plasmonic probes for improvement of scanning near-field optical microscopy

H Heydarian, A Shahmansouri, P Yazdanfar… - JOSA B, 2018 - opg.optica.org
Design and modeling of a class of scanning near-field optical microscope (SNOM) probe for
improving performance are reported. The basic idea is to generate more than one hot spot …