B Sun, C Xie, K Qu, L Cao, J Yan… - … Measurement on the …, 2021 - ieeexplore.ieee.org
Tapping atomic force microscope (TM-AFM) can measure soft samples, which has the advantages of low loss and high resolution, and has been widely used in the …
The unique ability of Atomic Force Microscopy (AFM) to image, manipulate and characterize materials at the nanoscale has made it a remarkable tool in nanotechnology. In dynamic …
T Lin, Q Lin, XL Yin, H Wang - Acta Microscopica, 2020 - search.ebscohost.com
The current research is mainly focused on the progress of COPD disease, and the observation of chronic obstructive pulmonary disease with gastroesophageal reflux disease …
Y Sato, K Shimizu - Journal of Signal Processing, 2019 - jstage.jst.go.jp
An atomic force microscope (AFM) is a microscope that measures the information of a sample surface when the probe tip approaches the surface. In our previous work, we …
A Sewaki, K Shimizu - Journal of Signal Processing, 2019 - jstage.jst.go.jp
In this study, we numerically investigate the oscillatory behavior of the cantilever probe in a dynamic AFM, which is approximated by a one-dimensional continuous model. In particular …