A Johannes, H Holland-Moritz… - … Science and Technology, 2015 - iopscience.iop.org
Nanostructured materials are today subject to intense research, as their mesoscopic properties will enable a variety of new applications in the future. They can be grown with …
The focused ion beam (FIB) is a powerful tool for fabrication, modification, and characterization of materials down to the nanoscale. Starting with the gallium FIB, which was …
PS Szabo, AR Poppe, H Biber, A Mutzke… - Geophysical …, 2022 - Wiley Online Library
The porosity of the upper layers of regolith is key to the interaction of an airless planetary body with precipitating radiation, but it remains difficult to characterize. One of the effects that …
SA Norris, MJ Aziz - Applied Physics Reviews, 2019 - pubs.aip.org
We review recent progress toward the development of predictive models of ion-induced pattern formation on room-temperature silicon, with a particular emphasis on efforts to …
Experimental results on the charge‐state‐dependent sputtering of metallic gold nanoislands are presented. Irradiations with slow highly charged ions of metallic targets were previously …
Sigmund's model of spatially resolved sputtering is the underpinning of many models of nanoscale pattern formation induced by ion bombardment. It is based on three …
Several proposed mechanisms and theoretical models exist concerning nanostructure evolution on III-V semiconductors (particularly GaSb) via ion beam irradiation. However …
The mean sputter yield produced by the impact of a single ion depends on the radii of curvature of the target surface at the point of impact. Using the Sigmund model of ion …
SA Norris, JC Perkinson, M Mokhtarzadeh… - Scientific reports, 2017 - nature.com
In this work we analyze GISAXS measurements of the structure factor of Si surfaces evolving during 1 keV Ar+ ion bombardment. Using newly-developed methods sensitive to the full …