Recent progress in high performance and reliable n-type transition metal oxide-based thin film transistors

JY Kwon, JK Jeong - Semiconductor Science and Technology, 2015 - iopscience.iop.org
This review gives an overview of the recent progress in vacuum-based n-type transition
metal oxide (TMO) thin film transistors (TFTs). Several excellent review papers regarding …

Enhancement of electrical stability of metal oxide thin-film transistors against various stresses

Y Kim, C Kim - Journal of Materials Chemistry C, 2023 - pubs.rsc.org
Metal-oxide semiconductors are considered promising alternative materials in the field of flat
panel display industry due to their advantages, such as high mobility, transparency …

Organic materials as a passivation layer for metal oxide semiconductors

D Ho, H Jeong, S Choi, C Kim - Journal of Materials Chemistry C, 2020 - pubs.rsc.org
Metal oxide semiconductors have gained much interest in the field of next generation
consumer electronics due to the worldwide development of flexible electronic devices and …

Multifunctional Organic‐Semiconductor Interfacial Layers for Solution‐Processed Oxide‐Semiconductor Thin‐Film Transistor

G Kwon, K Kim, BD Choi, J Roh, C Lee… - Advanced …, 2017 - Wiley Online Library
The stabilization and control of the electrical properties in solution‐processed amorphous‐
oxide semiconductors (AOSs) is crucial for the realization of cost‐effective, high …

Analysis on contact resistance and effective channel length of thin film transistors using composition-modified In–Ga–Zn-O active channels prepared with atomic layer …

DH Lee, YH Kwon, NJ Seong, KJ Choi… - ACS Applied …, 2022 - ACS Publications
To verify the effects of process conditions for the TFTs employing In–Ga–Zn-O (IGZO)
channels prepared by atomic layer deposition (ALD), such as cationic composition of …

Role of MoTi diffusion barrier in amorphous indium-gallium-zinc-oxide thin-film transistors with a copper source/drain electrode

JL Kim, CK Lee, MJ Kim, SH Lee, JK Jeong - Thin Solid Films, 2021 - Elsevier
This paper reports why the Cu/MoTi/In-Ga-Zn-O (IGZO) contact schematic exhibited
acceptable electrical properties and stability in an IGZO transistor that is used in a state-of …

Suppressing Undesired Channel Length‐Dependent Electrical Characteristics of Fully Integrated InGaZnO Thin‐Film Transistors via Defect Control Layer

KM Kim, JS Yang, HT Kim, I Han… - Advanced Electronic …, 2023 - Wiley Online Library
Demand for increased scalability of oxide thin‐film transistors (TFTs) continues to rise, along
with the need for ever‐higher integration densities and driving currents. However, the …

Impact of annealing on contact formation and stability of IGZO TFTs

T Mudgal, N Walsh, RG Manley… - ECS …, 2014 - iopscience.iop.org
Annealing processes were investigated on Indium-Gallium-Zinc-Oxide (IGZO) thin-film
transistors (TFTs). Molybdenum and aluminum were used as contact metals which defined …

High performance InGaZnO thin film transistor with InGaZnO source and drain electrodes

HC Wu, CH Chien - Applied Physics Letters, 2013 - pubs.aip.org
This work demonstrates In-Ga-Zn-O (IGZO) as source and drain electrodes in IGZO-thin film
transistors (TFTs). The fabricated TFT depicts excellent electrical properties; its mobility is …

Effects of source/drain electrodes on the performance of InSnO thin-film transistors

Q Li, D Han, J Dong, D Xu, Y Li, Y Wang, X Zhang - Micromachines, 2022 - mdpi.com
Oxide thin-film transistors (TFTs) are of increasing interest in the field of advanced displays.
In this work, we explore Al, InSnO (ITO), Ti, and Mo as source/drain electrodes of ITO TFTs. A …