Dosimetry techniques and radiation test facilities for total ionizing dose testing
F Ravotti - IEEE Transactions on Nuclear Science, 2018 - ieeexplore.ieee.org
This paper will address dosimetry and monitoring techniques for total ionizing dose (TID)
testing of electronics devices. We will first discuss the basic principles of dosimetry, as well …
testing of electronics devices. We will first discuss the basic principles of dosimetry, as well …
SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
The R2E project at CERN has tested a few commercial SRAMs and a custom-designed
SRAM, whose data are complementary to various scientific publications. The experimental …
SRAM, whose data are complementary to various scientific publications. The experimental …
Electron-induced upsets and stuck bits in SDRAMs in the Jovian environment
D Söderström, LM Luza, H Kettunen… - … on Nuclear Science, 2021 - ieeexplore.ieee.org
This study investigates the response of synchronous dynamic random access memories to
energetic electrons and especially the possibility of electrons to cause stuck bits in these …
energetic electrons and especially the possibility of electrons to cause stuck bits in these …
Design of FPGA-implemented Reed–Solomon erasure code (RS-EC) decoders with fault detection and location on user memory
Z Gao, L Zhang, Y Cheng, K Guo… - … Transactions on Very …, 2021 - ieeexplore.ieee.org
Reed-Solomon erasure codes (RS-ECs) are widely used in packet communication and
storage systems to recover erasures. When the RS-EC decoder is implemented on a field …
storage systems to recover erasures. When the RS-EC decoder is implemented on a field …
Physical mechanisms inducing electron single-event upset
P Caron, C Inguimbert, L Artola… - … on Nuclear Science, 2018 - ieeexplore.ieee.org
With the increase of sensitivity of devices to single-event upsets (SEUs), the possibility to
trigger an upset with incident electrons has been recently raised. All the mechanisms …
trigger an upset with incident electrons has been recently raised. All the mechanisms …
[PDF][PDF] First Experiments at the CLEAR user facility
Abstract The new" CERN Linear Electron Accelerator for Research"(CLEAR) facility at
CERN started its operation in fall 2017. CLEAR results from the conversion of the CALIFES …
CERN started its operation in fall 2017. CLEAR results from the conversion of the CALIFES …
CERN irradiation facilities
F Pozzi, RG Alia, M Brugger, P Carbonez… - Radiation protection …, 2018 - academic.oup.com
oup_raddos_ncx187 120..124 ++ Page 1 Radiation Protection Dosimetry (2018), Vol. 180, No.
1-4, pp. 120-124 doi:10.1093/rpd/ncx187 Advance Access publication 28 September 2017 …
1-4, pp. 120-124 doi:10.1093/rpd/ncx187 Advance Access publication 28 September 2017 …
Multiple-cell upsets induced by single high-energy electrons
MJ Gadlage, AH Roach, AR Duncan… - … on Nuclear Science, 2017 - ieeexplore.ieee.org
Multiple-cell upsets (MCUs) in static random access memory-based field-programmable
gate arrays from three different technology nodes are recorded from single-particle …
gate arrays from three different technology nodes are recorded from single-particle …
Systematic reliability evaluation of FPGA implemented CNN accelerators
Convolutional neural networks (CNN) have become essential for many scientific and
industrial applications, such as image classification and pattern detection. Among the …
industrial applications, such as image classification and pattern detection. Among the …
Status of VHEE radiotherapy related studies at the CLEAR user facility at CERN
Despite the increase in interest in using Very High Energy Electron (VHEE) beams for
cancer radiotherapy many unanswered questions in its development remain. The use of test …
cancer radiotherapy many unanswered questions in its development remain. The use of test …