Corrosion behavior of Sn-based lead-free solder alloys: a review

S Li, X Wang, Z Liu, Y Jiu, S Zhang, J Geng… - Journal of Materials …, 2020 - Springer
Sn-based lead-free solder alloys have been investigated widely to replace the traditional Sn–
Pb solder alloys. Since the miniaturization of electronic products and the expansion of …

A critical review of constitutive models for solders in electronic packaging

G Chen, X Zhao, H Wu - Advances in Mechanical …, 2017 - journals.sagepub.com
Owing to their superior electrical, thermal, and mechanical properties, solder joints are the
most widely used interconnection materials in electronic product packaging. Because the …

Finite element analysis of the effect of process-induced voids on the fatigue lifetime of a lead-free solder joint under thermal cycling

L Benabou, V Etgens, QB Tao - Microelectronics Reliability, 2016 - Elsevier
Process-induced voids remain one of the key concerns in thermo-mechanical reliability of
solder alloys. Previous studies reported that the void effect on fatigue failure reliability of …

Anand model and FEM analysis of SnAgCuZn lead-free solder joints in wafer level chip scale packaging devices

L Zhang, J Han, Y Guo, C He - Microelectronics Reliability, 2014 - Elsevier
In this paper, the constitutive response of SnAgCuZn solder was studied under uniaxial
tension. Anand model was used to represent the inelastic deformation behavior of the lead …

Pb-free solder joint thermo-mechanical modeling: state of the art and challenges

JPM Clech, RJ Coyle, B Arfaei - JOM, 2019 - Springer
Acceleration factors and predictive life models are of use to build-in board assembly
reliability and estimate solder joint life at the design stage. They allow designers to answer …

Effect of strain rate on interfacial fracture behaviors of Sn-58Bi/Cu solder joints

X Hu, X Yu, Y Li, Q Huang, Y Liu, Z Min - Journal of Materials Science …, 2014 - Springer
The interfacial reactions and mechanical properties of Sn-58Bi/Cu solder joints reflowed at
different temperatures ranging from 180 to 220° C for constant time of 10 min were …

Effect of SiC nanoparticles on SAC305-TSV reliability under thermal load

J Wang, L Ma, Y Wang, F Guo - Journal of Materials Science, 2022 - Springer
Through silicon via (TSV) is a kind of three-dimensional (3D) packaging technology with
great development potential, which can realize short distance electrical interconnection …

Thermal aging impact on microstructure, creep and corrosion behavior of lead-free solder alloy (SAC387) use in electronics

M Sadiq, M Khan, A Mateen, M Shahzad… - Microelectronics …, 2021 - Elsevier
This study aims to investigate the effects of thermal aging on microstructure changes, creep
behavior, and corrosion properties of 95.5 wt%-Sn, 3.8 wt%-Ag, 0.7 wt%-Cu (also known as …

A maximum entropy fracture model for low and high strain-rate fracture in TinSilverCopper alloys

DK Chan - 2012 - search.proquest.com
SnAgCu solder alloys exhibit significant rate-dependent constitutive behavior. Solder joints
made of these alloys exhibit failure modes that are also rate-dependent. Solder joints are an …

Effect of SiC nanoparticles on SAC305-TSV reliability under thermal load

W Jiaojiao, L Ma, W Yishu… - Journal of Materials …, 2022 - search.proquest.com
Through silicon via (TSV) is a kind of three-dimensional (3D) packaging technology with
great development potential, which can realize short distance electrical interconnection …