A new benchmark for instance-level image classification
K Kang, G Pang, X Zhao, J Wang, Y Li - IEEE Access, 2020 - ieeexplore.ieee.org
Although fine-grained image classification is able to classify more fine-grained sub-
categories compared to its coarse-grained counterpart, it often fails to identify individual …
categories compared to its coarse-grained counterpart, it often fails to identify individual …
A deep learning-based approach for defect classification with context information in semiconductor manufacturing
S Arena - thesis.unipd.it
This thesis presents some methodological and experimental contributions to a deep
learning-based approach for the automatic classifi cation of microscopic defects in silicon …
learning-based approach for the automatic classifi cation of microscopic defects in silicon …