Deflectometry for specular surfaces: an overview

J Burke, A Pak, S Höfer, M Ziebarth… - Advanced Optical …, 2023 - frontiersin.org
Deflectometry as a technique to assess reflective surfaces has now existed for some 40
years. Its different aspects and variations have been studied in multiple theses and research …

[HTML][HTML] Real-time 3D measurement of freeform surfaces by dynamic deflectometry based on diagonal spatial carrier-frequency pattern projection

MT Nguyen, J Lee, YS Ghim, HG Rhee - Measurement, 2022 - Elsevier
Deflectometry is a three-dimensional optical technique based on structured light projection
for measuring and inspecting specular freeform surfaces. Conventional deflectometry …

DYnet++: A Deep Learning Based Single-Shot Phase-Measuring Deflectometry for the 3-D Measurement of Complex Free-Form Surfaces

MT Nguyen, YS Ghim, HG Rhee - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Deflectometry is a three-dimensional optical technique based on the structured light
projection for measuring specular free-form surfaces. Much research on single-shot …

[HTML][HTML] From Single Shot to Structure: End-to-End Network-Based Deflectometry for Specular Free-Form Surface Reconstruction

MH Sepanj, S Moradi, A Nazemi, C Preston, AMD Lee… - Applied Sciences, 2024 - mdpi.com
Deflectometry is a key component in the precise measurement of specular (mirrored)
surfaces; however, traditional methods often lack an end-to-end approach that performs 3D …

Digital holographic camera with extended stochastic illumination for non-destructive inspection of silicon optics

G Dwivedi, L Pensia, SK Debnath, R Kumar - Journal of Optics, 2022 - iopscience.iop.org
In the present work, we propose a compact digital holographic camera (DHC) with extended
stochastic illumination for full-field non-destructive inspection of silicon optics fabricated in a …

Novel calibration method for the refractive parameters of transparent screens

Y Fu, W Yang, F Ma, G Jiang… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Biplanar deflectometry based on transparent screens (TSs) does not necessitate any
movement of the screen or the addition of a spectroscope, mitigating the issues of complex …

[HTML][HTML] Wavefront error peak removal by carrier phase reconstruction technique for slope measurement type sensors

MT Nguyen, HG Rhee, YS Ghim - Optics and Lasers in Engineering, 2024 - Elsevier
A robust and novel technique for wavefront retrieval from slope data is presented in this
paper. A simple wavefront with stable error is used as a carrier wavefront for measurement …

Dynamic deflectometry for real-time 3D surface measurements

YS Ghim, HG Rhee - Quantum Sensing and Metrology, 2024 - opg.optica.org
As a summary of the authors' previous paper of Ref 1, we describe a simple and high speed
deflectometry for measuring specular surfaces accurately and efficiently. Conventional …

Deep learning-based phase measuring deflectometry for one-shot measurement and inspection of specular free-form surfaces

YS Ghim, HG Rhee - Interferometry and Structured Light …, 2024 - spiedigitallibrary.org
Deflectometry is a non-contact optical technique used for measuring specular free-form
surfaces by projecting structured light using a display screen (LCD screen). While one-shot …

High-precision binocular fringe reflectometry based on normal vector consistency

Y Li, B Cui, Z Zhao, D Li, J Zhou - International Conference on …, 2024 - spiedigitallibrary.org
Modern manufacturing industry has a strong measurement demand of specular surfaces.
Fringe reflection method has the advantages of simple structure, low cost, high accuracy …